Structure on the dense residual wire core during exploding wire plasma formation
- Cornell Univ., Ithaca, NY (United States). Lab. of Plasma Studies
Multiframe, high resolution (1--5 micron, 0.7--2 ns) x-ray (2--4 keV) backlighting has been used to study the formation of plasma when single wire and multiwire arrays are exploded using the {approximately}450 kA XP pulser at Cornell University. The wire plasmas were imaged using 13--25 micron Mo wire, and 20 micron Pd wire, 150--200 kA x-pinch x-ray backlighters which were <5 microns in size and about 1 ns in duration. It is well established now that an exploding wire plasma produced by a {approximately}100 ns pulsed power generator initially consists of a relatively low density coronal plasma surrounded by a dense residual wire core. Two images of the wire cores separated in time by 5--20 ns have been obtained 40--70 ns after the start of the current pulse with 2--4 keV x-rays using different geometries. Fine structure on the wire core surface with a spatial scale of 10--20 microns has been recorded on film at times when the wire core is about ten times that diameter. The structure, which appears to be dominantly azimuthally symmetric, is reminiscent of the Rayleigh-Taylor instability, and it is observed to increase in amplitude from the first backlighter frame to the second. The authors have also observed that the resistivity of the wire material appears to affect the rate at which the wire core expands. For example, by 40--50 ns after the start of the current pulse, the residual wire core has expanded to 3--5 times the initial wire diameters for higher resistivity wire materials (Ti, Fe, Ni, Pd, W), and to 5--10 times the initial wire diameters for lower resistivity materials (Al, Cu, Ag, Au) under the same conditions.
- Sponsoring Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- OSTI ID:
- 338517
- Report Number(s):
- CONF-980601-; TRN: 99:005818
- Resource Relation:
- Conference: 25. international conference on plasma science, Raleigh, NC (United States), 1-4 Jun 1998; Other Information: PBD: 1998; Related Information: Is Part Of IEEE conference record -- Abstracts. 1998 IEEE international conference on plasma science; PB: 343 p.
- Country of Publication:
- United States
- Language:
- English
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