Single-photon ionization of helium from 4.5 to 12 keV by Compton scattering and the photoelectric effect

Journal Article · Sat May 01 00:00:00 EDT 1999 · Physical Review A

DOI:https://doi.org/10.1103/PhysRevA.59.4075· OSTI ID:337538

Morgan, D V; Bartlett, R J ^[1]

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1. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

We have measured the ratio of the cross sections for double-to-single ionization in helium for several monoenergetic photon energies between 4.5 and 12 keV using time-of-flight ion charge state spectroscopy. In this energy range, both the photoelectric effect and inelastic (Compton) scattering contribute significantly to the total cross section. The ionization states caused by Compton scattering were distinguished from those caused by the photoelectric effect by the different recoil energies of the helium ion associated with the two processes. The ratios of the double-to-single ionization cross sections of helium for the photoelectric effect (R{sub p}) and for Compton scattering (R{sub c}) are given, and compared with previous measurements and theoretical calculations. The measured value for R{sub c} at 12 keV is (1.21{plus_minus}0.27){percent}, which agrees well with the theoretical calculations of Andersson and Burgd{umlt o}rfer [Phys. Rev. A {bold 50}, R2810 (1994)]. thinsp {copyright} {ital 1999} {ital The American Physical Society}

• OSTI ID: 337538
• Journal Information: Physical Review A, Journal Name: Physical Review A Journal Issue: 5 Vol. 59; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
COMPTON EFFECT
CROSS SECTIONS
HELIUM
KEV RANGE 01-10
KEV RANGE 10-100
PHOTOELECTRIC EFFECT
PHOTOIONIZATION
TIME-OF-FLIGHT METHOD