Magnetic structure of deformation-induced shear bands in amorphous Fe{sub 80}B{sub 16}Si{sub 4} observed by magnetic force microscopy
- Center for Materials Science, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
- Materials Science and Technology Division, (MST-8), Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
- Department of Chemistry, Princeton University, Princeton, New Jersey 08544 (United States)
- Division of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138 (United States)
Processing-induced magnetic structures in amorphous metallic alloys are of interest because of their impact on the performance of materials used in electric device applications. Plastic deformation associated with cutting or bending the material to the desired shape occurs through the formation of shear bands. The stress associated with these shear bands induces magnetic domains that can lead to power losses through interaction with the fields and currents involved in normal device operation. These domains have been studied previously using a variety of techniques capable of imaging magnetic domain structures. In an effort to better characterize and understand these issues, we have applied atomic and magnetic force microscopy to these materials to provide three-dimensional nanometer-scale topographic resolution and micrometer-scale magnetic resolution. {copyright} {ital 1999 American Institute of Physics.}
- OSTI ID:
- 336613
- Journal Information:
- Journal of Applied Physics, Vol. 85, Issue 8; Other Information: PBD: Apr 1999
- Country of Publication:
- United States
- Language:
- English
Similar Records
Sub-surface characterization and three dimensional profiling of semiconductors by magnetic resonance force microscopy
Thickness scaling of ferroelectricity in BiFeO 3 by tomographic atomic force microscopy