Observation of Molecular Layering in Thin Liquid Films Using X-Ray Reflectivity

Journal Article · Mon Mar 01 00:00:00 EST 1999 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.82.2326· OSTI ID:329720

Yu, C; Richter, A G; Datta, A; Durbin, M K; Dutta, P ^[1]

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1. Department of Physics and Astronomy, Northwestern University, Evanston, Illinois 60208-3112 (United States)

We report the direct observation of internal layering in thin ({approximately} 45{endash} 90 {Angstrom} ) liquid films of nearly spherical, nonpolar molecules, tetrakis(2-ethylhexoxy)silane, using synchrotron x-ray reflectivity. The Patterson functions have secondary maxima indicating layer formation, and model-independent fitting to the reflectivity data shows that there are three electron density oscillations near the solid-liquid interface, with a period of {approximately} 10 {Angstrom} (consistent with the molecular dimensions). The oscillation amplitude has a strong inverse dependence on the substrate surface roughness. {copyright} {ital 1999} {ital The American Physical Society}

• OSTI ID: 329720
• Journal Information: Physical Review Letters, Vol. 82, Issue 11; Other Information: PBD: Mar 1999
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ORGANIC COMPOUNDS
ELECTRON DENSITY
LIQUIDS
THIN FILMS
SILANES
X-RAY DIFFRACTION
SYNCHROTRON RADIATION
REFLECTIVITY
PATTERSON METHOD
LAYERS
NSLS