Diminished electron cloud broadening in a silicon drift detector by sawtooth p{sup +} strips

Journal Article · Mon Feb 01 04:00:00 EST 1999 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.747767· OSTI ID:328409

Sonsky, J; Valk, H; Allier, C P; Hollander, R W; Eijk, C W.E. van; Sarro, P M ^[1]

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1. Delft Univ. of Technology (Netherlands)

Already in 1993, sawtooth-shaped p{sup +} strips were proposed to diminish lateral diffusion in linear multi-anode silicon drift detectors. The sawtooth structure generates small electric fields directed parallel to the detector surface and perpendicular to the drift direction. These fields confine the drifting electrons within a sawtooth period. In this paper the authors present for the first time experimental proof of the applicability of the concept. For a sawtooth period of 500 {micro}m, the authors have tested the confinement of electron clouds as a function of injected charge up to 5 {times} 10{sup 6} electrons. The maximum number of electrons for which full confinement is achieved has been measured as a function of the potential gutter depth generated by different sawtooth angles.

• OSTI ID: 328409
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 1 Vol. 46; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
CONFINEMENT
DESIGN
DRIFT CHAMBERS
ELECTRON DRIFT
POSITION SENSITIVE DETECTORS
SI SEMICONDUCTOR DETECTORS