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Title: HgI{sub 2} two-dimensional arrays based on resistive charge division readout

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OSTI ID:323862
; ;  [1]
  1. Dipt di Scienze Fisiche, Napoli (Italy)

Newly designed HgI{sub 2} two-dimensional arrays based on resistive charge division, obtained by depositing a Ge surface resistive layer between the readout Pd strips, have been fabricated. These detectors, coupled with very low noise preamplifiers, have shown a high detection efficiency over a large active area and an energy resolution of 15% for X-ray energy E{sub x} = 60 keV ({sup 241}Am), becoming {approx} 9% at E{sub x} = 122 keV ({sup 57}Cl). Further, a spatial sensitivity of {approx} 5 {micro}m and a spatial resolution of {approx} 40 {micro}m in both the directions parallel to the anode and to the cathode strips have been obtained at an energy equivalent to {approx} 40 keV, by making use, for a fine spatial characterization of the devices, of a laser beam spot with wavelength tuned to match the crystal bandgap (582 nm). These devices, with optimized cathode layer resistances, could be successfully employed in basic research (for example Bragg X-ray spectrometry) and for imaging in radiological and space applications, at least in the important energy range 40 < E{sub x} < 120 keV.

OSTI ID:
323862
Report Number(s):
CONF-971201-; TRN: 99:004394
Resource Relation:
Conference: 1997 fall meeting of the Materials Research Society, Boston, MA (United States), 1-5 Dec 1997; Other Information: PBD: 1998; Related Information: Is Part Of Semiconductors for room-temperature radiation detector applications 2; James, R.B. [ed.] [Sandia National Labs., Livermore, CA (United States)]; Schlesinger, T.E. [ed.] [Carnegie Mellon Univ., Pittsburgh, PA (United States)]; Siffert, P. [ed.] [Lab. PHASE/CNRS, Strasbourg (France)]; Dusi, W. [ed.] [Inst. TESRE/CNR, Bologna (Italy)]; Squillante, M.R. [ed.] [Radiation Monitoring Devices, Inc., Watertown, MA (United States)]; O`Connell, M. [ed.] [Dept. of Energy, Washington, DC (United States)]; Cuzin, M. [ed.] [LETI/CEA, Grenoble (France)]; PB: 681 p.; Materials Research Society symposium proceedings, Volume 487
Country of Publication:
United States
Language:
English