PL and EPR spectroscopy of point defects in detector-grade Cd{sub 1{minus}x}Zn{sub x}Te
- West Virginia Univ., Morgantown, WV (United States). Dept. of Physics
- Digirad Corp., San Diego, CA (United States)
Cadmium zinc telluride (CdZnTe) is an emerging material for room-temperature X-ray and gamma ray detectors. The identification and control of point defects and charge compensators are currently important issues. Low-temperature photoluminescence (PL) and electron paramagnetic resonance (EPR) spectroscopies have been used to characterize point defects in CdZnTe crystals grown by the high-pressure Bridgman technique. Luminescence due to shallow donors, shallow acceptors, and deeper acceptors was monitored for a series of samples. An isotropic EPR signal attributed to shallow hydrogenic donors is observed in all samples, and the concentration of shallow donors has been determined. The nature of the defect centers (impurities, vacancies, vacancy-impurity complexes), and the correlation between defect concentration and device performance is discussed.
- Sponsoring Organization:
- National Aeronautics and Space Administration, Washington, DC (United States)
- OSTI ID:
- 323828
- Report Number(s):
- CONF-971201-; TRN: 99:004360
- Resource Relation:
- Conference: 1997 fall meeting of the Materials Research Society, Boston, MA (United States), 1-5 Dec 1997; Other Information: PBD: 1998; Related Information: Is Part Of Semiconductors for room-temperature radiation detector applications 2; James, R.B. [ed.] [Sandia National Labs., Livermore, CA (United States)]; Schlesinger, T.E. [ed.] [Carnegie Mellon Univ., Pittsburgh, PA (United States)]; Siffert, P. [ed.] [Lab. PHASE/CNRS, Strasbourg (France)]; Dusi, W. [ed.] [Inst. TESRE/CNR, Bologna (Italy)]; Squillante, M.R. [ed.] [Radiation Monitoring Devices, Inc., Watertown, MA (United States)]; O`Connell, M. [ed.] [Dept. of Energy, Washington, DC (United States)]; Cuzin, M. [ed.] [LETI/CEA, Grenoble (France)]; PB: 681 p.; Materials Research Society symposium proceedings, Volume 487
- Country of Publication:
- United States
- Language:
- English
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