Comparison between cadmium zinc telluride crystals grown in Russia and in the Ukraine
Book
·
OSTI ID:323820
- Sandia National Labs., Livermore, CA (United States)
A comparative analysis of different Cd{sub 1{minus}x}Zn{sub x}Te (CZT) crystals grown by a vertical high pressure Bridgman (VHPB) method is reported. The results of several analytical techniques, such as triple axis X-ray diffraction (TAD), rocking curves, low temperature photoluminescence (PL), scanning electron microscopy (SEM), and proton induced X-ray emission (PIXE) are discussed. Segregated carbon inclusions were identified by SEM and energy dispersive X-ray fluorescence (EDXRF), and the results are interpreted in terms of constitutional supercooling of the solidifying CZT melt. The carbon inclusions significantly decrease the resistivity, and in some cases, the noise is too large for the fabrication of radiation detectors. Combining these results with other measurements reported by their research team, the authors identify correlations between the growth and the defects in these CZT crystals.
- OSTI ID:
- 323820
- Report Number(s):
- CONF-971201--
- Country of Publication:
- United States
- Language:
- English
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Analysis of CZT crystals and detectors grown in Russia and the Ukraine by high-pressure Bridgman methods
Book
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Wed Dec 30 23:00:00 EST 1998
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OSTI ID:323849
Analysis of CZT crystals and detectors grown in Russia and the Ukraine by high-pressure Bridgman methods
Journal Article
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Tue Jun 01 00:00:00 EDT 1999
· Journal of Electronic Materials
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OSTI ID:362098
Analysis of CZT crystals and detectors grown in Russia and the Ukraine by high-pressure Bridgman methods
Conference
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Sun Jan 09 23:00:00 EST 2000
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OSTI ID:751141