Structural stability diagrams for thin-film multilayers

Conference · Wed Dec 30 23:00:00 EST 1998

OSTI ID:323512

Dregia, S A; Banerjee, R; Fraser, H L ^[1]

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1. Ohio State Univ., Columbus, OH (United States). Dept. of Materials Science and Engineering

Structural stability in thin-film multilayers is described in terms of classical thermodynamics, involving the competition between bulk and interfacial energies. A new type of phase diagram is introduced, the biphase diagram, in which concurrent phase stabilities are mapped as a function of two degrees of freedom, corresponding to two independent layer thicknesses in a periodic multilayer. The model is used to explain the observations of phase stabilities in Al/Ti multilayers, as a function of varying layer thicknesses. The model is also applied to explain the experimental observations made by other investigators on phase stability in Co/Cr thin-film multilayers.

• OSTI ID: 323512
• Report Number(s): CONF-971201--
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM
CHROMIUM
COBALT
COMPOSITE MATERIALS
LAYERS
PHASE DIAGRAMS
PHASE STUDIES
THERMODYNAMICS
THIN FILMS
TITANIUM