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Pulse buildup dynamics of an actively mode-locked laser diode array in an external cavity

Journal Article · · IEEE Journal of Quantum Electronics
DOI:https://doi.org/10.1109/3.364398· OSTI ID:32003
; ; ;  [1]
  1. National Chiao Tung Univ., Hsinchu (Taiwan, Province of China). Inst. of Electro-optical Engineering

Dynamic pulse evolution characteristics of an actively mode-locked laser diode array in the external cavity have been investigated. Numerical calculations based on modified traveling-wave rate equations reproduced experimentally observed pulse and spectral width evolution and show that the buildup time is about 45 round-trips. The authors have also performed a theoretical analysis to understand which of the laser operating parameters would affect the buildup dynamics. It is shown that either higher dc bias current or larger radiative recombination coefficient (which is inversely proportional to the excited-state lifetime) will render the laser exhibiting shorter steady-state pulse width and faster evolution to the steady state. Other parameters affecting the buildup, but to a lesser extent, include the radio-frequency (RF) modulation current, spontaneous emission coefficient, and gain coefficient. The power reflectivities of the output mirror and the antireflection coated diode facet, on the other hand, have little effect on the pulse width and buildup time for single pulse generation.

Sponsoring Organization:
USDOE
OSTI ID:
32003
Journal Information:
IEEE Journal of Quantum Electronics, Journal Name: IEEE Journal of Quantum Electronics Journal Issue: 3 Vol. 31; ISSN 0018-9197; ISSN IEJQA7
Country of Publication:
United States
Language:
English

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