Photodetachment photoelectron spectroscopy of doubly charged anions: S{sub 2}O{sub 8}{sup 2{minus}}
- Department of Physics, Washington State University, Richland, Washington 99352 (United States)
A photodetachment photoelectron spectroscopy study of a doubly charged anion (S{sub 2}O{sub 8}{sup 2{minus}}) in the gas phase is reported at three photon energies: 193, 266, 355 nm. Adiabatic and vertical electron binding energies of S{sub 2}O{sub 8}{sup 2{minus}} were measured to be 1.7{plus_minus}0.2 and 2.2{plus_minus}0.1 eV, respectively. Several excited states were observed for the S{sub 2}O{sub 8}{sup {minus}} singly charged anion at 193 nm. The repulsive Coulomb barrier that binds multiply charged anions was clearly shown in the detachment spectra of S{sub 2}O{sub 8}{sup 2{minus}}. The effects of the Coulomb barrier to the detachment spectra and electron tunneling through the barrier are presented. The barrier height, which is equivalent to the magnitude of the Coulomb repulsion between the two excess charges in S{sub 2}O{sub 8}{sup 2{minus}} was estimated to be {approximately}3 eV. {copyright} {ital 1999 American Institute of Physics.}
- OSTI ID:
- 304234
- Journal Information:
- Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 8 Vol. 110; ISSN JCPSA6; ISSN 0021-9606
- Country of Publication:
- United States
- Language:
- English
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