FTIR, EPMA, Auger, and XPS analysis of impurity precipitates in CdS films

Conference · Wed Dec 31 04:00:00 EST 1997

OSTI ID:302515

Webb, J D; Rose, D H; Niles, D W; Swartzlander, A; Al-Jassim, M M ^[1]

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1. National Renewable Energy Lab., Golden, CO (United States)

Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdS films. In this work, the authors present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. They also show that some of these impurities exist as 10{sup 2} micron-scale precipitates.

• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC36-83CH10093
• OSTI ID: 302515
• Report Number(s): CONF-970953--
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
CADMIUM SULFIDES
CADMIUM TELLURIDE SOLAR CELLS
CHEMICAL COATING
COPPER SELENIDE SOLAR CELLS
GALLIUM SELENIDES
IMPURITIES
INDIUM SELENIDE SOLAR CELLS
MICROSTRUCTURE
PHYSICAL VAPOR DEPOSITION
SOLAR ABSORBERS