Reconstruction of 2D line-integrated electron density using angular filter refractometry and a fast marching Eikonal solver

McCluskey, B.; Griff-McMahon, J.; Haberberger, D.; Valenzuela-Villaseca, V.; Landsberger, H.; Fox, W.

doi:10.1063/5.0295850

Reconstruction of 2D line-integrated electron density using angular filter refractometry and a fast marching Eikonal solver

Journal Article · Wed Dec 03 00:00:00 EST 2025 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/5.0295850· OSTI ID:3008782

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Princeton Univ., NJ (United States); Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)
Univ. of Rochester, NY (United States). Laboratory for Laser Energetics
Princeton Univ., NJ (United States)
Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States); Univ. of Maryland, College Park, MD (United States)

Refraction of an optical probe beam by a plasma can be measured with angular filter refractometry (AFR), which produces an image of the beam’s 2D spatial profile that contains intensity contours corresponding to curves of constant refraction angle. Further analysis is required to reconstruct the underlying line-integrated electron density. Most prior efforts to calculate density from AFR data have been limited to 1D analysis or forward-fitting techniques. Here, in this paper, we detail the use of a fast-marching Eikonal solver to directly invert AFR data and obtain the full 2D line-integrated electron density. The analysis method is first verified with synthetic data and then applied to experimental measurements of single and colliding plasma plumes collected at the OMEGA EP Laser Facility. The calculated densities agree with 1D results and are shown to be consistent with the original AFR measurements via forward modeling. We also discuss ways to improve the precision of this technique.

View Accepted Manuscript (DOE)

Research Organization:: Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: NA0003613; NA0004034

OSTI ID:: 3008782

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 12 Vol. 96; ISSN 1089-7623; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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