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Coded-mask-based wavefront sensing technique for APS nanofocusing beamline diagnostics

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/5.0256447· OSTI ID:3001938
 [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Argonne National Laboratory (ANL), Argonne, IL (United States)
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Here, we extend our recently developed coded-mask wavefront sensing technique to enable single-shot measurements of nanofocused x-ray beams. This method accurately reconstructs the focal beam profile by backpropagating the wavefront measured downstream of the beam focus. To validate its performance, we benchmarked it against the conventional fluorescence wire scan method, successfully measuring ∼120 nm focal spots at the 28-ID-B beamline of the Advanced Photon Source using a polymeric compound refractive lens. The results highlight the effectiveness of coded-mask wavefront sensing for high-precision beam profiling and its application as a real-time wavefront monitoring tool.
Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
3001938
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 6 Vol. 96; ISSN 1089-7623; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (14)

X-ray active mirror coupled with a Hartmann wavefront sensor
  • Idir, Mourad; Mercere, Pascal; Modi, Mohammed H.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3 https://doi.org/10.1016/j.nima.2009.10.168
journal May 2010
A large field-of-view high-resolution hard x-ray microscope using polymer optics journal November 2020
Single-shot x-ray phase-contrast and dark-field imaging based on coded binary phase mask journal July 2021
Diffraction-limited storage rings – a window to the science of tomorrow journal August 2014
X-ray optics and beam characterization using random modulation: theory journal February 2020
X-ray optics and beam characterization using random modulation: experiments journal February 2020
A method for enforcing integrability in shape from shading algorithms journal July 1988
Quantitative characterization of aberrations in x-ray optics conference September 2016
Interoperability and complementarity of simulation tools for beamline design in the OASYS environment conference August 2017
Single-shot speckle tracking method based on wavelet transform and multi-resolution analysis conference September 2020
Wavelet-transform-based speckle vector tracking method for X-ray phase imaging journal January 2020
Real-time machine-learning-driven control system of a deformable mirror for achieving aberration-free X-ray wavefronts journal June 2023
Real-time X-ray phase-contrast imaging using SPINNet—a speckle-based phase-contrast imaging neural network journal January 2022
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating journal January 2016

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