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Rutherford-in-Copper-Channel Conductor for the MARCO Solenoidal Detector Magnet

Journal Article · · IEEE Transactions on Applied Superconductivity
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  1. Commissariat a l'Energie Atomique et aux Energies Alternatives (CEA-Saclay), Gif-sur-Yvette (France). Institut de Recherche sur les Lois Fondamentales de l'Univers (IRFU); Univ. Paris-Saclay, Gif-sur-Yvette (France)
  2. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
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MARCO will be a superconducting solenoid for a new particle physics detector of the upcoming Electron Ion Collider (EIC) at Brookhaven National Laboratory (NY, USA). The design field at the interaction point is 2.0 T with a nominal current of about 4 kA at 4.5 K. For this magnet, an aluminumstabilized conductor was considered at the very preliminary design phase. After that, since the lack of manufacturers able to deal with aluminum extrusion, copper has been chosen as stabilizer. Thanks to a dedicated design effort, the copper stabilizer and accompanying material choices provided acceptable hadronic interaction length. The conductor is based on a NbTi Rutherford cable that is soldered in a U-shaped copper profile. Here, this paper goes through the definition of the conductor crosssection according to the project requirements and the supplier capabilities. Its characteristics will be detailed and discussed, in particular the RRR and the yield strength of the copper channel needed for protection and mechanics respectively. Finally, a proposal on how to make the joint between two conductors is presented.
Research Organization:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Nuclear Physics (NP)
Grant/Contract Number:
AC05-06OR23177
OSTI ID:
2997167
Report Number(s):
JLAB-PHY--25-4265
Journal Information:
IEEE Transactions on Applied Superconductivity, Journal Name: IEEE Transactions on Applied Superconductivity Journal Issue: 8 Vol. 35; ISSN 1051-8223; ISSN 2378-7074; ISSN 1558-2515
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)Copyright Statement
Country of Publication:
United States
Language:
English

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