A simulation of recrystallization based on EBSD orientation microscopy data

Conference · Tue Dec 01 04:00:00 EST 1998

OSTI ID:296815

Engler, O

The present paper introduces a novel stochastic two-dimensional model to simulate the evolution of microstructure and texture during recrystallization. The model is based on data derived by automated large-scale EBSD local texture analysis, i.e., by orientation microscopy. Each measured point is characterized by its coordinates x and y in the microstructure, its crystallographic orientation g and a parameter q describing the quality of the EBSD-pattern which is affected by lattice strain and hence discloses information on the dislocation density. The concurrent information on the local arrangement of orientations and dislocation densities is utilized to derive conclusions on the nucleation and subsequent growth of the new recrystallized grains. The principles of the model are outlined and three example are shown to illustrate the possibilities of the model to simulate the evolution of microstructure and texture during recrystallization.

• Research Organization: Los Alamos National Lab., Center for Materials Science, NM (United States)
• Sponsoring Organization: USDOE Assistant Secretary for Human Resources and Administration, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 296815
• Report Number(s): LA-UR--98-2443; CONF-980964--; ON: DE99001270
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALLOYS
DISLOCATIONS
MATHEMATICAL MODELS
METALS
MICROSTRUCTURE
RECRYSTALLIZATION
TEXTURE