The Paris exponent and dislocation crack tip shielding
Conference
·
OSTI ID:293056
- Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
A crack blunting dislocation emission mechanism likely leads to a Paris fatigue crack growth rate law exponent n = 2 if dislocation shielding is not important. This paper considers how dislocation crack tip shielding can cause a reduction in the fatigue crack growth rate as well as an increase in the Paris exponent n. The blunting radius in the crack tip shear sliding model of Laird and Smith and of Neumann sets an upper limit to the rate of growth of fatigue cracks that advance with the formation of fatigue striations. Dislocation crack tip shielding should cause the fatigue crack growth rate to be reduced. Dislocation crack tip shielding also may increase the value of the Paris law exponent.
- OSTI ID:
- 293056
- Report Number(s):
- CONF-970980--; ISBN 0-87339-382-1
- Country of Publication:
- United States
- Language:
- English
Similar Records
The Paris law for fatigue crack growth in terms of the crack tip opening displacement
Near threshold fatigue curve based on the dislocation shielding model of fracture
Atomic-Scale Mechanism of Crack-Tip Plasticity: Dislocation Nucleation and Crack-Tip Shielding
Conference
·
Tue Dec 30 23:00:00 EST 1997
·
OSTI ID:293054
Near threshold fatigue curve based on the dislocation shielding model of fracture
Conference
·
Thu Dec 31 23:00:00 EST 1987
·
OSTI ID:6418028
Atomic-Scale Mechanism of Crack-Tip Plasticity: Dislocation Nucleation and Crack-Tip Shielding
Journal Article
·
Fri Aug 01 00:00:00 EDT 1997
· Physical Review Letters
·
OSTI ID:664458