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U.S. Department of Energy
Office of Scientific and Technical Information

Waveguide Zeeman interferometry for thin-film chemical sensors

Conference ·
OSTI ID:292832
; ; ; ;  [1]; ; ;  [2]; ;  [3]
  1. Los Alamos National Lab., NM (United States)
  2. Optical Sciences Center, Univ. of Arizona, Tucson, AZ (United States)
  3. VTT Electronics (Finland)

A chemical sensor is demonstrated which is based on Si{sub 3}N{sub 4} optical waveguides coated with species-selective thin films and using Zeeman interferometry as the detection technique. Relative phase change between TE and TM modes is measured. Real time and reversible response to toluene is shown with ppm level sensitivity.

Research Organization:
Los Alamos National Lab., NM (United States)
Sponsoring Organization:
USDOE Assistant Secretary for Management and Administration, Washington, DC (United States); USDOE Assistant Secretary for Human Resources and Administration, Washington, DC (United States); USDOE, Washington, DC (United States); National Science Foundation, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
292832
Report Number(s):
LA-UR--97-4007; CONF-9710157--; ON: DE98003020
Country of Publication:
United States
Language:
English