Creep mechanisms and interface-enhanced deformation twinning in a two-phase lamellar TiAl alloy
Deformation mechanisms and the role of interfaces in deformation twinning of a two-phase [TiAl({gamma})/Ti{sub 3}Al({alpha}{sub 2})] lamellar alloy creep deformed at elevated temperatures have been investigated. Since the multiplication of lattice dislocations within both {gamma} and {alpha}{sub 2} lamellae is very limited at a low stress level due to a refined lamellar microstructure, the glide of interfacial dislocations on both {gamma}/{alpha}{sub 2} and {gamma}/{gamma} interfaces (i.e interface sliding) becomes an important deformation mode. Obstacles such as impinged lattice dislocations can impede the movement of interfacial dislocations, which glide in a cooperative fashion along the lamellar interfaces. The impediment of dislocation motion subsequently causes a dislocation pile-up in front of obstacles as creep strain accumulates. When the crystals deform at high stress level, deformation twinning becomes a predominant deformation mode. Deformation twins are found to nucleate from the interfaces as a result of a local stress concentration generated from dislocation pile-ups. It is suggested that the deformation twinning in lamellar TiAl/Ti{sub 3}Al crystals can be vieived as a stress relaxation process for the concentration of stress at the head of each dislocation pile-up. An interface-assisted twinning mechanism is accordingly proposed and discussed.
- Research Organization:
- Lawrence Livermore National Lab., CA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 289275
- Report Number(s):
- UCRL-JC--130082; CONF-980716--; ON: DE98058773; BR: KC0201050
- Country of Publication:
- United States
- Language:
- English
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