Magnetic circular dichroism in reflection electron energy loss spectroscopy?
- Department of Physics and Astronomy, Ohio University, Athens, Ohio 45701 (United States)
- IBM Research Division, Almaden Research Center, San Jose, California 95120-6099 (United States)
We evaluate the possibility of using dichroic electron energy loss spectroscopy (DEELS) as an alternative to x-ray magnetic circular dichroism (XMCD). It is well known that electron energy loss spectroscopy and x-ray absorption spectroscopy provide similar information. A simple semiclassical model suggests that reflection DEELS might have a magnetic sensitivity similar to that of XMCD. This sensitivity will be reduced, however, by multiple scattering of the probe electron before and after the energy loss event. Thus, it is difficult to predict the magnitude of the DEELS effect. Experiments were performed at the {ital L} edges of polycrystalline Fe, Co, and Ni thin-film samples prepared {ital in} {ital situ} with a uniaxial magnetic bias. Even in these most favorable cases, the DEELS effect is limited to less than one-tenth of related effects in XMCD. {copyright} {ital 1996 American Vacuum Society}
- OSTI ID:
- 288419
- Report Number(s):
- CONF-9510389--
- Journal Information:
- Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 4 Vol. 14; ISSN JVTBD9; ISSN 0734-211X
- Country of Publication:
- United States
- Language:
- English
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