Spin-resolved x-ray photoemission studies of ferromagnetic metals
- Department of Chemistry and Zettlemoyer Center for Surface Studies, Lehigh University, Bethlehem, Pennsylvania 18015 (United States)
Recent spin-resolved x-ray photoelectron spectroscopy (SRXPS) studies of ferromagnetic metals are reviewed. SRXPS studies of metallic Fe, Co, Co{sub 66}Fe{sub 4}Ni{sub 1}B{sub 14}Si{sub 15}, and Ni demonstrate that core-level photoemission, and the itinerant electron response to core-hole creation, are highly spin-dependent. The exchange splitting of the Fe 2{ital p}{sub 3/2} level is found to be 0.48{plus_minus}0.05 eV. Lifetime broadening results for the Fe 2{ital p}{sub 3/2} {ital N}{up_arrow} (majority spin) and {ital N}{down_arrow} (minority spin) components indicate conservation of spin in core-hole filling processes involving the valence band. SRXPS study of the Fe 2{ital p}{sub 3/2} peak asymmetry {alpha} reveals a dependence of electron{endash}hole excitation on the spin of the core hole. Spin analysis of the Fe 3{ital s} XPS line shape shows it to be a three-component spectrum, rather than the two-component line shape assumed previously. A photon energy dependence of one of the Fe 3{ital s} components explains disagreement among previous Fe 3{ital s} XPS results. Comparisons of SRXPS from Co metal and Co{sub 66}Fe{sub 4}Ni{sub 1}B{sub 14}Si{sub 15} directly demonstrate the effect of a reduced atomic magnetic moment on the spin dependence of core-level XPS. The behavior of lifetime broadenings for the {ital N}{up_arrow} and {ital N}{down_arrow} Co 2{ital p}{sub 3/2} components show that the reduced Co magnetic moment found in the Co{sub 66}Fe{sub 4}Ni{sub 1}B{sub 14}Si{sub 15} amorphous glass is due to the transfer of {up_arrow}-spin valence electron density to the {down_arrow}-spin valence band upon glass formation. SRXPS also allows investigation of spin-dependent core-hole screening processes and satellite production, as demonstrated in SRXPS studies of ferromagnetic Ni. Future directions of SRXPS are also explored. {copyright} {ital 1996 American Vacuum Society}
- OSTI ID:
- 288418
- Report Number(s):
- CONF-9510389--
- Journal Information:
- Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 4 Vol. 14; ISSN 0734-211X; ISSN JVTBD9
- Country of Publication:
- United States
- Language:
- English
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