Dielectric, structural and microstructural characteristics of tetragonal-structured PLZT relaxors
Conference
·
OSTI ID:28838
- Univ. of Illinois, Urbana, IL (United States)
Tetragonal PLZT ceramics (Zr/Ti = 40/60) with lanthanum contents of approximately 12 atomic% posses a unique transformation. Dielectric constant measurements have revealed a spontaneous switching between relaxor and normal ferroelectric behaviors, in addition significant thermal hysteresis effects were observed near the switching temperature. Temperature dependent x-ray line broadening above the switching temperature was observed which revealed the development of significant internal strain indicating the presence of local cubic-tetragonal structural transformations which preserve the average cubic symmetry, while line splitting was observed below the switching temperature indicating the formation of a macroscopic tetragonal structure. Micropolar domain coarsening and a subsequent transformation to a normal micron-sized domain configuration was observed by hot-stage transmission electron microscopy.
- OSTI ID:
- 28838
- Report Number(s):
- CONF-931142--; CNN: Grant N00014-92-J-1522
- Country of Publication:
- United States
- Language:
- English
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