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X-ray emission from plasmas created by smoothed KrF laser irradiation

Journal Article · · Physics of Plasmas
DOI:https://doi.org/10.1063/1.871496· OSTI ID:286963
; ; ;  [1]; ; ;  [2]; ; ; ; ; ; ; ; ; ; ;  [3]; ;  [4]
  1. Science Applications International Corporation, McLean, Virginia 22102 (United States)
  2. Space Science Division, Naval Research Laboratory, Washington, D.C. 20375 (United States)
  3. Plasma Physics Division, Naval Research Laboratory, Washington, D.C. 20375 (United States)
  4. SFA Inc., 1401 McCormick Drive, Landover, Maryland 20785 (United States)
The x-ray emission from plasmas created by the Naval Research Laboratory Nike KrF laser [Phys. Plasmas {bold 3}, 2098 (1996) ] was characterized using imaging and spectroscopic instruments. The laser wavelength was 1/4 {mu}m, and the beams were smoothed by induced spatial incoherence (ISI). The targets were thin foils of CH, aluminum, titanium, and cobalt and were irradiated by laser energies in the range 100{endash}1500 J. A multilayer mirror microscope operating at an energy of 95 eV recorded images of the plasma with a spatial resolution of 2 {mu}m. The variation of the 95 eV emission across the 800 {mu}m focal spot was 1.3{percent} rms. Using a curved crystal imager operating in the 1{endash}2 keV x-ray region, the density, temperature, and opacity of aluminum plasmas were determined with a spatial resolution of 10 {mu}m perpendicular to the target surface. The spectral line ratios indicated that the aluminum plasmas were relatively dense, cool, and optically thick near the target surface. The absolute radiation flux was determined at 95 eV and in x-ray bandpasses covering the 1{endash}8 keV region. The electron temperature inferred from the slope of the x-ray flux versus energy data in the 5{endash}8 keV region was 900 eV for an incident laser energy of 200 J and an intensity of {approx_equal}10{sup 13} W/cm{sup 2}.
OSTI ID:
286963
Journal Information:
Physics of Plasmas, Journal Name: Physics of Plasmas Journal Issue: 9 Vol. 3; ISSN PHPAEN; ISSN 1070-664X
Country of Publication:
United States
Language:
English

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