Resonant X-Ray Fluorescence Spectroscopy of Correlated Systems: A Probe of Charge-Transfer Excitations

Journal Article · Mon Jul 01 04:00:00 EDT 1996 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.77.574· OSTI ID:286745

Butorin, S M; Mancini, D C; Guo, J; Wassdahl, N; Nordgren, J; Nakazawa, M; Tanaka, S; Uozumi, T; Kotani, A; Ma, Y; Myano, K E; Karlin, B A; Shuh, D K ^[1]

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1. Department of Physics, Uppsala University, Box 530, S-751 21 Uppsala (Sweden)

X-ray fluorescence spectroscopy with monochromatic photon excitation is presented as a tool for studies of charge-transfer excitations in correlated systems, using CeO{sub 2} and UO{sub 3} as examples. Ce 4{ital f}{r_arrow}3{ital d} and U 5{ital f}{r_arrow}3{ital d} x-ray fluorescence, with excitation near the 3{ital d} thresholds, probes states as eigenvalues for the ground state Hamiltonian from the Anderson impurity model. Sweeping the excitation energy across 3{ital d} absorption edges enhances contributions of different electronic configurations to fluorescence so that observed resonances indicate the charge-transfer origin of the absorption satellites. {copyright} {ital 1996 The American Physical Society.}

• OSTI ID: 286745
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 3 Vol. 77; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION EDGE
CERIUM OXIDES
ELECTRON TRANSFER
ELECTRONIC STRUCTURE
EXCITATION
IMPURITIES
RESONANCE
URANIUM OXIDES
X-RAY FLUORESCENCE ANALYSIS