Defect identification using the core-electron contribution in Doppler-broadening spectroscopy of positron-annihilation radiation

Journal Article · Thu Aug 01 04:00:00 EDT 1996 · Physical Review, B: Condensed Matter

DOI:https://doi.org/10.1103/PhysRevB.54.4722· OSTI ID:286720

Szpala, S; Asoka-Kumar, P; Nielsen, B; Peng, J P; Hayakawa, S; Lynn, K G ^[1]; Gossmann, H ^[2]

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1. Department of Physics, Brookhaven National Laboratory, P.O. Box 5000, Upton, New York 11973 (United States)
2. AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974 (United States)

Reduction of background using a coincidence-detection system in Doppler-broadening spectroscopy of positron-annihilation radiation allows us to examine the contribution of high-momentum core electrons. The contribution is used as a fingerprint to identify chemical variations at a defect site. The technique is applied to study a variety of open volume defects in Si, including decorated vacancies associated with doping. {copyright} {ital 1996 The American Physical Society.}

• Research Organization: Brookhaven National Laboratory
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 286720
• Journal Information: Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 7 Vol. 54; ISSN PRBMDO; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANNIHILATION
CHEMICAL ANALYSIS
DEFECTS
DOPPLER BROADENING
IDENTIFICATION SYSTEMS
MEASURING METHODS
POSITRONS
SILICON