Near-edge x-ray absorption of carbon materials for determining bond hybridization in mixed {ital sp}2/{ital sp}3 bonded materials
- Stanford Synchrotron Radiation Laboratory, Stanford, California 94309 (United States)
- Stanford University, Stanford, California 94309 (United States)
- Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
Near-edge x-ray absorption fine structure (NEXAFS) measurements were performed on a variety of carbon materials, covering a range of hybrid bonding character from pure {ital sp}3 type to pure {ital sp}2 type. Diamond, chemical vapor deposited (CVD) diamond films of varying quality. Diamond-like carbon (DLC) films, and graphite were examined with this technique and these measurements were compared with Raman spectroscopy results and scanning electron microscopy images of carbon film morphology. For the mixed {ital sp}2 and {ital sp}3 bonded DLC materials, NEXAFS does not suffer from the large Raman cross-section difference between {ital sp}2 and {ital sp}3 type bonds, thus allowing unambiguous characterization of carbon thin films with a broader range of {ital sp}2/{ital sp}3 bonding ratios than possible with Raman spectroscopy alone. This capability was used to determine the transition point where the sequential-CVD carbon film growth technique produces predominately {ital sp}3 or {ital sp}2 bonded material. {copyright} {ital 1996 American Institute of Physics.}
- Research Organization:
- Stanford Linear Accelerator Center
- DOE Contract Number:
- AC03-76SF00515; W-7405-ENG-48
- OSTI ID:
- 286306
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 4 Vol. 69; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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