Compliance measurements of confined polystyrene solutions by atomic force microscopy

Journal Article · Wed Jan 31 23:00:00 EST 1996 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.76.1272· OSTI ID:286150

Overney, R M; Leta, D P; Pictroski, C F; Rafailovich, M; Liu, Y; Quinn, J; Sokolov, J; Eisenberg, A; Overney, G ^[1]

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1. Exxon Research and Engineering Company, 1545, Route 22 East, Annandale, New Jersey 08801 (United States)

The use of the atomic force microscope (AFM) as a local probe for elastohydrodynamic lubrication is discussed. Compliances are measured with a modified AFM that allows application of ac and dc force-displacement curves on end-grafted poly(styrene) chains in good (tuluene) and poor (water) solvents. In toluene, the chains form a stretched brush whose elastic modulus is an order of magnitude larger than that of the collapsed layer in water. The dc force displacement curves are compared to those previously obtained on similar systems with the surface forces apparatus. {copyright} {ital 1996 The American Physical Society.}

• DOE Contract Number: FG02-93ER45481
• OSTI ID: 286150
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 8 Vol. 76; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ATOMIC FORCE MICROSCOPY
LUBRICATING PROPERTIES
MICROSCOPY
MICROSTRUCTURE
POLYMERS
POLYSTYRENE
RHEOLOGY
SOLUTIONS
SOLVENTS
TOLUENE
WATER