Demonstration of emittance compensation through the measurement of the slice emittance of a 10-ps electron bunch

Journal Article · Wed May 01 00:00:00 EDT 1996 · Physical Review Letters

OSTI ID:285702

Qui, X; Batchelor, K; Ben-Zvi, I; Wang, X ^[1]

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1. National Synchrotron Light Source Department, Brookhaven National Laboratory, Upton, New York 11973 (United States)

The beam matrix of a picosecond long slice of an electron bunch was measured. A short slice is selected out of an energy chirped beam by a slit in a dispersive region. The emittance is measured using the quadrupole scan technique. We observe the process of emittance compensation of the beam by repeating the measurement for various values of the compensating solenoid and for several slices. {copyright} {ital 1996 The American Physical Society.}

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 285702
• Journal Information: Physical Review Letters, Vol. 76, Issue 20; Other Information: PBD: May 1996
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
66 PHYSICS
ELECTRONS
BEAM BUNCHING
BEAM EMITTANCE
PHOTON EMISSION SCANNING
QUADRUPOLES
SOLENOIDS