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Title: High-resolution spectroscopy using synchrotron radiation for surface structure determination and the study of correlated electron systems

Abstract

The surface structure of three molecular adsorbate systems on transition metal surfaces, (√3 x √3)R30° and (1.5 x 1.5)R18° CO adsorbed on Cu(111), and c(2x2) N2/Ni(100), have been determined using Angle-Resolved Photoemission Extended Fine Structure (ARPEFS). The adsorption site and bond lengths are reported for the adsorbate-metal bond and the first two substrate layers. The ARPEFS diffraction pattern of the shake-up peak for c(2x2) N2/Ni(100) is also discussed. A unique method of experimentally determining the angular momentum and intrinsic/extrinsic origin of core-level satellites is presented. We show for the first time that satellite peaks not associated with chemically differentiated atomic species display an ARPEFS intensity oscillation. Specifically, we present data for the C 1s from (√3x√3)R30 CO/Cu(111) and p2mg(2x1)CO/Ni(110), N is from c(2x2) N2/Ni(100), and Ni 3p from clean nickel(111). The satellite peaks in all cases exhibit ARPEFS curves which indicate an angular momentum identical to the main peak and are of an intrinsic nature. A Fourier Transform Soft X-ray spectrometer (FF-SX) has been designed and is under construction for the Advanced Light Source (ALS) at Lawrence Berkeley National Laboratory. The spectrometer is designed for ultra-high resolution theoretical resolving power E/ΔE≈-10 6 in the photon energy region of 60-120 eV.more » This instrument is expected to provide experimental results which sensitively test models of correlated electron processes in atomic and molecular physics. The design criteria and consequent technical challenges posed by the short wavelengths of x-rays and desired resolving power are discussed. The fundamental and practical aspects of soft x-ray interferometry are also explored.« less

Authors:
 [1]
  1. Univ. of California, Berkeley, CA (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
285455
Report Number(s):
LBNL-38901; LSBL-330
ON: DE96014411; TRN: 96:005060
DOE Contract Number:
AC03-76SF00098
Resource Type:
Thesis/Dissertation
Resource Relation:
Other Information: TH: Thesis (Ph.D); PBD: May 1996
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; NICKEL; PHOTOELECTRON SPECTROSCOPY; COPPER; NITROGEN; X-RAY SPECTROMETERS; DESIGN; FOURIER TRANSFORM SPECTROMETERS; X-RAY SPECTROSCOPY; ADVANCED LIGHT SOURCE; ELECTRON DIFFRACTION

Citation Formats

Moler, Jr., Edward John. High-resolution spectroscopy using synchrotron radiation for surface structure determination and the study of correlated electron systems. United States: N. p., 1996. Web. doi:10.2172/285455.
Moler, Jr., Edward John. High-resolution spectroscopy using synchrotron radiation for surface structure determination and the study of correlated electron systems. United States. doi:10.2172/285455.
Moler, Jr., Edward John. Wed . "High-resolution spectroscopy using synchrotron radiation for surface structure determination and the study of correlated electron systems". United States. doi:10.2172/285455. https://www.osti.gov/servlets/purl/285455.
@article{osti_285455,
title = {High-resolution spectroscopy using synchrotron radiation for surface structure determination and the study of correlated electron systems},
author = {Moler, Jr., Edward John},
abstractNote = {The surface structure of three molecular adsorbate systems on transition metal surfaces, (√3 x √3)R30° and (1.5 x 1.5)R18° CO adsorbed on Cu(111), and c(2x2) N2/Ni(100), have been determined using Angle-Resolved Photoemission Extended Fine Structure (ARPEFS). The adsorption site and bond lengths are reported for the adsorbate-metal bond and the first two substrate layers. The ARPEFS diffraction pattern of the shake-up peak for c(2x2) N2/Ni(100) is also discussed. A unique method of experimentally determining the angular momentum and intrinsic/extrinsic origin of core-level satellites is presented. We show for the first time that satellite peaks not associated with chemically differentiated atomic species display an ARPEFS intensity oscillation. Specifically, we present data for the C 1s from (√3x√3)R30 CO/Cu(111) and p2mg(2x1)CO/Ni(110), N is from c(2x2) N2/Ni(100), and Ni 3p from clean nickel(111). The satellite peaks in all cases exhibit ARPEFS curves which indicate an angular momentum identical to the main peak and are of an intrinsic nature. A Fourier Transform Soft X-ray spectrometer (FF-SX) has been designed and is under construction for the Advanced Light Source (ALS) at Lawrence Berkeley National Laboratory. The spectrometer is designed for ultra-high resolution theoretical resolving power E/ΔE≈-106 in the photon energy region of 60-120 eV. This instrument is expected to provide experimental results which sensitively test models of correlated electron processes in atomic and molecular physics. The design criteria and consequent technical challenges posed by the short wavelengths of x-rays and desired resolving power are discussed. The fundamental and practical aspects of soft x-ray interferometry are also explored.},
doi = {10.2172/285455},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed May 01 00:00:00 EDT 1996},
month = {Wed May 01 00:00:00 EDT 1996}
}

Thesis/Dissertation:
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