Experimental hole densities in HgBa{sub 2}Ca{sub {ital n}{minus}1}Cu{sub {ital n}}O{sub 2{ital n}+2+{delta}} compounds from near-edge x-ray-absorption spectroscopy
Journal Article
·
· Physical Review, B: Condensed Matter
- Materials Science Centre, University of Groningen, Nijenborgh 4, NL-9747 AG Groningen (The Netherlands)
- Institut fuer Festkoerper- und Werkstofforschung Dresden e.V., Institut fuer Festkoerperforschung, Postfach 270016, D-01171 Dresden (Federal Republic of Germany)
- Synchrotron Radiation Research Center, Hsinchu Science-Based Industrial Park, Hsinchu 300 (Taiwan)
- Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-5932 (United States)
Near-edge x-ray-absorption spectroscopy measurements have been performed on the O {ital K}- and Cu {ital L}-absorption edges on a series of underdoped and optimally doped HgBa{sub 2}Ca{sub {ital n}{minus}1}Cu{sub {ital n}}O{sub 2{ital n}+2+{delta}} samples in order to get quantitative information on the changes in the electronic structure under doping with excess O. The density of doped holes with O 2{ital p} character per CuO{sub 2} plane per unit cell in the optimized samples is found to be close to that of other {ital p}-type doped superconducting cuprates with optimized {ital T}{sub {ital c}}. There is also some evidence for a decreasing density of theses doping-induced O 2{ital p} hole states per CuO{sub 2} plane per unit cell with increasing number {ital n} of CuO{sub 2} sheets for the samples with optimized {ital T}{sub {ital c}}. Finally, a quantitative analysis of the experimental data leads to doping levels in the Hg systems that are half of what is expected in a simple ionic picture. {copyright} {ital 1996 The American Physical Society.}
- Research Organization:
- Brookhaven National Laboratory
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 285372
- Journal Information:
- Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 5 Vol. 53; ISSN 0163-1829; ISSN PRBMDO
- Country of Publication:
- United States
- Language:
- English
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