Lattice dynamics of ultrathin layers of KBr grown epitaxially on RbCl(001)
- Departments of Physics and Chemistry and Center for Materials Research and Technology, Florida State University, Tallahassee, Florida 32306 (United States)
- Institut fuer Theoretische Physik, Universitaet Regensburg, Universitaetsstrasse 32, 93040 Regensburg (Germany)
High-resolution helium-atom scattering experiments were performed on epitaxially grown layers of KBr on a RbCl(001) substrate for films 1, 2, and 3 ML thick. The layer-by-layer growth was monitored {ital in} {ital situ} by measuring the intensity of the specularly scattered He beam versus coverage. Measurements of the single-phonon inelastic scattering were carried out on each succeeding layer to determine the surface-phonon dispersion in both the {Gamma}{ital M} and {Gamma}{ital X} high-symmetry directions of the surface Brillouin zone. Shell-model potential parameters were determined in a consistent fashion for the four anion-cation constituents at the interface, which gave a good fit to the dispersion curve data from 1-, 2-, and 3-ML KBr/RbCl epitaxially grown systems as reported in this study and, in addition, the bulk and clean surface dispersions of KBr, RbCl, KCl, and RbBr were fit by the same parameters. {copyright} {ital 1996 The American Physical Society.}
- DOE Contract Number:
- FG05-85ER45208
- OSTI ID:
- 284369
- Journal Information:
- Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 20 Vol. 53; ISSN 0163-1829; ISSN PRBMDO
- Country of Publication:
- United States
- Language:
- English
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