Penta-prism long trace profiler (PPLTP) for measurement of grazing incidence space optics

Technical Report · Wed May 01 04:00:00 EDT 1996

DOI:https://doi.org/10.2172/281879· OSTI ID:281879

Qian, S ^[1]; Li, H ^[2]; Takacs, P Z

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1. Sincrotrone Trieste, Trieste (Italy)
2. Continental Optical Corp., New York (United States)

The Long Trace Profiler (LTP) is in use at a number of locations throughout the world for the measurement of the figure and mid- frequency roughness of x-ray mirrors. The standard configuration requires that the surface tested lie in a horizontal plane as the optical head is scanned along a horizontal line. For applications where gravity-induced sag of the surface cannot be tolerated, such as in x-ray telescope mirror metrology, it is desirable to measure the mirror as it is mounted in a vertical configuration. By making simple modifications to the standard LTP system, we have demonstrated that it is possible to use the LTP principle to measure the surface of x- ray mirrors and mandrels mounted in the vertical orientation. The major change in the LTP system is the use of a penta prism on a vertical translation stage to direct the probe beam onto the surface and the addition of a precision rotation stage to hold the test object. A 3-D map of the surface topography of the complete cylindrical asphere can be generated quite easily with this technique. Measurements with a prototype system indicate a slope error accuracy of better than 1 microradian is possible, with a figure error repeatability of better than 50 nm. 19 refs., 4 figs.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 281879
• Report Number(s): BNL--62826; CONF-9608112--1; ON: DE96011810; CNN: NASA SBIR Contract No. NAS8-40514
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
EXPERIMENTAL DATA
MEASURING METHODS
MIRRORS
SHAPE
TELESCOPES
TESTING
X-RAY EQUIPMENT