By reflectivity of circularly polarized soft x rays (abstract)
- Naval Research Laboratory, Code 6345, Washington, DC 20375 (United States)
- National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973 (United States)
- AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974 (United States)
The reflectivity of circularly polarized (CP) soft x rays is a technique which combines the power of x-ray scattering and magnetic circular dichroism and allows the structural {ital and} magnetic characterization of heteromagnetic multilayers. In this technique, the energy and angular dependence of the differential reflectivity of left- and right-circularly polarized soft x rays at the relevant absorption edges of the constituent elements of the multilayers are measured. As examples the reflectivity curves for single films of Fe, Co, ordered and disordered Fe{sub 50}Co{sub 50} alloys, and for a trilayer consisting of two single crystal Fe{sub 30}Co{sub 70} films separated by an 8.7 A Mn spacer layer media utilizing complex dielectric tensors with no free parameters show that the rich reflectivity curves can be used to determine the multilayer magnetic ordering, film thicknesses, interface quality, as well as differentiating between ordered and disordered alloys. {copyright} {ital 1996 American Institute of Physics.}
- OSTI ID:
- 281718
- Report Number(s):
- CONF-951101--
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 8 Vol. 79; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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