Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Laser ablation inductively coupled plasma-atomic emission spectroscopy: Factors influencing the amount and composition of the ablated volume

Conference ·
OSTI ID:273547
; ; ; ;  [1]
  1. Lawrence Berkeley National Lab., CA (United States); and others

Laser ablation with inductively coupled plasma (LA-ICP) is a powerful technology for direct solid sample chemical analysis. Many of the advantages are well established, including no sample preparation and direct analysis of any sample material. A short-pulsed high-power laser beam {open_quotes}ablates{close_quotes} material from the solid sample into vapor components. The vapor is carried to the ICP for spectrochemical analysis, either by atomic emission spectroscopy (AES) or mass spectroscopy (MS). The sensitivity and accuracy of analysis are determined by the amount and composition of the ablated vapor, respectively. However, the violent laser ablation interaction is not well established fundamentally, so that one cannot predict, a-priori, the amount and composition of the vapor from an unknown sample. This research addresses several parameters that influence the quantity and composition of ablated vapor, including laser power density, atmosphere environment in the ablation chamber, and operating parameters of the ICP. These studies serve to define the optimum conditions for using laser ablation sampling for direct solid chemical analysis.

OSTI ID:
273547
Report Number(s):
CONF-960113--
Country of Publication:
United States
Language:
English

Similar Records

Laser ablation mass removal versus incident power density during solid sampling for inductively coupled plasma atomic emission spectroscopy
Journal Article · Thu Dec 14 23:00:00 EST 1995 · Analytical Chemistry (Washington) · OSTI ID:171376

Correlation of laser ablation plasma emission with ICP-AES signal intensity
Conference · Fri Dec 30 23:00:00 EST 1994 · OSTI ID:191647

Laser ablation: Fundamental principles for analytical applications
Conference · Fri Dec 30 23:00:00 EST 1994 · OSTI ID:191646