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Title: Electroluminescence and electrophotoluminescence of thin-film radiators based on SrS:Ce

Journal Article · · Journal of Applied Spectroscopy
DOI:https://doi.org/10.1007/BF02606577· OSTI ID:272691

Thin-film electroluminescent radiators (TFELR) based on alkali-earth sulfides activated by the ions of rare-earth elements (REE) have recently been the subject of intensive research. Interest in these radiators is generated by the fact that they are most promising for creating color screens for monitors. In particular, SrS:Ce-based radiators are efficient in the blue spectrum; the activator radiation in them is due to a resolved electron transition 5d({sup 2}D)-4f({sup 2}F) in the luminescence center Ce{sup 3+}. The mechanism of excitation of the luminescence centers in these devices was studied in a number of works. It was established that it is different from the excitation only one radiation peak occurs in one voltage pulse that is located on the leading edge of the exciting pulse, the presence of a second peak, occurring with a drop in the voltage pulse, is characteristic for the brightness waves of CaS:RE- or SrS:RE-based radiators. The concentration of localized electrons and ionized luminescence centers can be substantially affected by irradiating the specimen with a UV light. This action, as it was shown, led to the occurrence of bursts of large brightness in TFELR based on a CaS:Eu and SrS:Ce when the exciting voltage is applied. To elucidate the role of trapping sites and in the process of brightness wave formation, the effect of UV irradiation on the brightness waves for different amplitudes of the exciting voltage in SrS:Ce-based TFELR. A clear difference in the shape of the brighness waves expressed predominately in two aspects: asymmetry affected by cesium concentration and peak attenuation is more inertial for some specimens. It was concluded that kinetics of brightness waves is largely determined by the process of generation of free charge carriers.

Sponsoring Organization:
USDOE
OSTI ID:
272691
Journal Information:
Journal of Applied Spectroscopy, Vol. 62, Issue 1; Other Information: PBD: Jul-Aug 1995; TN: Translated from Zhurnal Prikladnoi Spektroskopii; 62: No. 1, 135-141(Jan-Feb 1995)
Country of Publication:
United States
Language:
English

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