Surface oxidation of selenium treated GaAs(100)
Journal Article
·
· Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
- NTT Interdisciplinary Research Laboratories, Tokyo (Japan)
The surface oxidation of Se treated GaAs(100) has been investigated in order to understand in greater detail the degradation of the Se passivated GaAs surface upon exposure to atmosphere. An increase in band bending is initially observed at relatively low exposure times, which corresponds to an increase in the O 2p intensity in the valence band. At this stage, oxygen is thought to weakly physisorb at the Ga vacancy sites. At intermediate exposure levels, the other unadsorbed oxygen atom of O{sub 2} attacks the nearest Ga atom. The bond between the nearest Ga atom and Se is then severed, resulting in the formation of Se, which closely resembles amorphous Se. Ultimately, both Se states are converted to the amorphouslike state and at longer exposure times are oxidized. At longer exposure times, the oxidation of Se is also accompanied by As oxidation. In contrast to S treated GaAs, Se/GaAs is relatively resistant to oxidation where only about 10% of the As is oxidized (As{sub 2}O{sub 3}) after 180 min of exposure versus oxidation of 34% of the As atoms for S/GaAs after only 20 min of atmosphere exposure. This relative oxidation resistance is attributed to greater penetration of Se into GaAs relative to S into GaAs. 11 refs., 7 figs., 1 tab.
- OSTI ID:
- 263448
- Journal Information:
- Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 6 Vol. 12; ISSN 0734-211X; ISSN JVTBD9
- Country of Publication:
- United States
- Language:
- English
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