Automated Algorithms for Screening Electronic Parts for Aging using Power Spectra Analysis (PSA) Data

Conference · Sun Sep 01 00:00:00 EDT 2024

DOI:https://doi.org/10.2172/2585991· OSTI ID:2585991

Multari, Rosalie A ^[1]; DeJong, Stephanie ^[1]; Carnali, Abigail Elizabeth ^[1]; Christiansen, Joel Timothy ^[1]; Carilli, Kelsey Monique ^[1]

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1. Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Understanding the age of semiconductor parts being built into devices and systems is of interest for manufacturing quality control. Power spectrum analysis (PSA) is a fast, non-destructive, sensitive method for examining semiconductor parts. This talk will cover the use of multivariate analysis on both PSA data and conventional current-voltage data generated prior to PSA analysis to create algorithms that can be automated to screen semiconductor parts for aging.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: NA0003525
• OSTI ID: 2585991
• Report Number(s): SAND2024-09493C; 1751261
• Country of Publication: United States
• Language: English