Fail-Safe Logic Design Strategies Within Modern FPGA Architectures

Bhakta, Priya A.; Plusquellic, Jim; Suchanek, Andrew; Mannos, Tom J.

doi:10.1109/access.2024.3520877

Fail-Safe Logic Design Strategies Within Modern FPGA Architectures

Journal Article · Thu Dec 19 23:00:00 EST 2024 · IEEE Access

DOI:https://doi.org/10.1109/access.2024.3520877· OSTI ID:2584552

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Univ. of New Mexico, Albuquerque, NM (United States)
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Fail-safe computing refers to computing systems that revert to a non-operational safe state when a fault occurs. In this paper, we investigate a circuit level technique as mitigation for single event upsets (SEUs) and fault injection attacks on field programmable gate arrays (FPGAs), and analyze the effectiveness of the technique as a fail-safe monitor for an encryption algorithm. The propagation of fault effects through FPGA primitives including lookup tables (LUTs) and programmable interconnect points (PIPs) is assessed within an FPGA architecture created using an open source tool, and validated using fault injection experiments on an FPGA. The analysis reveals additional vulnerabilities exist within reconfigurable architectures over those in equivalent fail-safe application specific integrated circuit (ASIC), thus requiring a more elaborate network of redundant circuits and checking logic. The configuration memory bits (CMBs), which configure routing and designate logic functions within the LUTs of the FPGA, add complexity to fail-safe design strategies by introducing additional fault conditions and fault propagation paths. A resource-efficient fail-safe circuit design technique called DEsign for Fail-safe in reCONfigurable systems (DEFCON) is proposed. The benefits and limitations associated with DEFCON are described in the context of fault injection experiments carried out as simulations and in FPGA hardware.

View Accepted Manuscript (DOE)

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA); USDOE Laboratory Directed Research and Development (LDRD) Program

Grant/Contract Number:: NA0003525

OSTI ID:: 2584552

Journal Information:: IEEE Access, Journal Name: IEEE Access Vol. 13; ISSN 2169-3536

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

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