X-ray induced synthesis of beta tin (β-Sn)

Malik, Trimaan; Cifligu, Petrika; Pravica, Michael; Park, Changyong; Evlyukhin, Egor

doi:10.1016/j.jpcs.2024.112351

X-ray induced synthesis of beta tin (β-Sn)

Journal Article · Sat Sep 21 00:00:00 EDT 2024 · Journal of Physics and Chemistry of Solids

DOI:https://doi.org/10.1016/j.jpcs.2024.112351· OSTI ID:2574423

^[1]; ^[1]; Pravica, Michael ^[1]; ^[2]; ^[1]

Univ. of Nevada, Las Vegas, NV (United States)
Argonne National Laboratory (ANL), Argonne, IL (United States)

The destabilization of molecular structures via hard X-rays has been previously utilized to synthesize novel compounds. Here, in this study, we report that the monochromatic X-ray induced decomposition of tin(II) oxalate (SnC₂O₄) at ambient and 0.6 GPa pressures lead to the formation of beta tin (β-Sn). At 1 GPa, only the degradation of SnC₂O₄ crystal structure is observed without any indication of β-Sn at the end of irradiation. The maximum transformation yield is achieved at 0.6 GPa suggesting the critical role of intermolecular distance in X-ray induced synthesis of β-Sn. Moreover, a modified Avrami equation is utilized to describe the kinetics and geometry of structural synthesis at ambient and 0.6 GPa. The obtained results demonstrate that X-ray irradiation can induce photochemical synthetic pathways different from conventional methods (e.g., high pressure, temperature, stoichiometric mixing) and that high pressure (HP) can be considered a tool to control X-ray induced photochemistry.

View Accepted Manuscript (DOE)

Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: National Science Foundation (NSF); USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)

Grant/Contract Number:: AC02-06CH11357; SC0023248

OSTI ID:: 2574423

Journal Information:: Journal of Physics and Chemistry of Solids, Journal Name: Journal of Physics and Chemistry of Solids Vol. 196; ISSN 0022-3697

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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