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Title: Optimization of textured-dielectric coatings for crystalline-silicon solar cells

Conference ·
OSTI ID:257305
 [1]; ;  [2]
  1. Sandia National Labs., Albuquerque, NM (United States). Photovoltaic System Components Dept.
  2. Harvard Univ., Cambridge, MA (United States). Dept. of Chemistry

The authors report on the optimization of textured-dielectric coatings for reflectance control in crystalline-silicon (c-Si) photovoltaic modules. Textured-dielectric coatings reduce encapsulated-cell reflectance by promoting optical confinement in the module encapsulation; i.e., the textured-dielectric coating randomizes the direction of rays reflected from the dielectric and from the c-Si cell so that many of these reflected rays experience total internal reflection at the glass-air interface. Some important results of this work include the following: the authors demonstrated textured-dielectric coatings (ZnO) deposited by a high-throughput low-cost deposition process; they identified factors important for achieving necessary texture dimensions; they achieved solar-weighted extrinsic reflectances as low as 6% for encapsulated c-Si wafers with optimized textured-ZnO coatings; and they demonstrated improvements in encapsulated cell performance of up to 0.5% absolute compared to encapsulated planar cells with single-layer antireflection coatings.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
257305
Report Number(s):
SAND-95-2805C; CONF-960513-13; ON: DE96011841; TRN: AHC29615%%1
Resource Relation:
Conference: 25. photovoltaic solar energy conference, Washington, DC (United States), 13-17 May 1996; Other Information: PBD: [1996]
Country of Publication:
United States
Language:
English