Mitigation of hot-electron preheat from the two-plasmon-decay instability using silicon-doped plastic shells in direct-drive implosions on OMEGA

Churnetski, K.; Patel, D.; Theobald, W.; Betti, R.; Cao, D.; Ceurvorst, L.; Rosenberg, M. J.; Solodov, A. A.; Stoeckl, C.; Regan, S. P.

doi:10.1063/5.0230737

Mitigation of hot-electron preheat from the two-plasmon-decay instability using silicon-doped plastic shells in direct-drive implosions on OMEGA

Journal Article · Fri Nov 22 00:00:00 EST 2024 · Physics of Plasmas

DOI:https://doi.org/10.1063/5.0230737· OSTI ID:2567841

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University of Rochester, NY (United States)
University of Rochester, NY (United States); Focused Energy GmbH, Darmstadt (Germany)

Hot electrons generated by the two-plasmon-decay (TPD) instability in laser-direct-drive implosions preheat the fuel and degrade performance. The mitigation of preheat using silicon-doped ablators (i.e., preheat is reduced by a factor of 1.40 ± 0.04) while decreasing the ratio of the laser spot diameter to the target diameter (⁠R_b/R_t⁠) to mitigate cross-beam energy transfer has been demonstrated on the OMEGA laser for quarter-critical laser intensities of 4.1 x 10¹⁴ W/cm²⁠, equivalent to an incident laser intensity of 8.3 x 10¹⁴ W/cm²⁠. The silicon dopant increases the electron temperature of the ablation plasma, which raises the intensity threshold for the onset of the TPD instability. These results show that implosion designs utilizing higher drive intensities can be used to achieve higher shell velocities, which are currently inaccessible with plastic ablators due to excessive preheat.

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Research Organization:: University of Rochester, NY (United States)

Sponsoring Organization:: USDOE; USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: NA0004144

OSTI ID:: 2567841

Alternate ID(s):: OSTI ID: 2500767

Journal Information:: Physics of Plasmas, Journal Name: Physics of Plasmas Journal Issue: 11 Vol. 31; ISSN 1070-664X

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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