Neutrons and Synchrotron Radiation in Engineering Materials Science
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January 2017
Enhanced Proton Conductivity in Y-Doped BaZrO 3 via Strain Engineering
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October 2017
Investigations on macroscopic intrinsic stress in amorphous binary-alloy films
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January 1992
Method for the Vacuum Deposition of Optical Coatings on Polymethyl Methacrylate
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April 2007
Evaluation of stress gradients ??ij(z) from their discrete laplace transforms ??ij(τk) obtained by x-ray diffraction performed in the scattered vector mode
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August 1996
Berechnung der Fließgrenze von Mischkristallen auf Grund der Plastizitätsbedingung für Einkristalle .
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January 1929
Aluminum films deposited by rf sputtering
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March 1970
Residual stress measurement of refractory coatings as a nondestructive evaluation
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March 1985
Role of the Transfer Film on the Friction and Wear of Metal Carbide Reinforced Amorphous Carbon Coatings During Run-in
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May 2009
Micron-Scale Residual Stress Measurement by Micro-Hole Drilling and Digital Image Correlation
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May 2011
Quantifying the Effect of Stress on Sn Whisker Nucleation Kinetics
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September 2017
Real-time stress evolution during Si1-xGex Heteroepitaxy: Dislocations, islanding, and segregation
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September 1997
X-ray residual stress measurements on cold-drawn steel wire
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October 1982
Velocity of propagation in the shock-crystallization of sputtered amorphous germanium
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August 1973
The origins of stress in thin nickel films
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September 1972
Stresses in thin films: The relevance of grain boundaries and impurities
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May 1976
The influence of bias sputter parameters on thick copper coatings deposited using a hollow cathode
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January 1977
The compressive stress transition in Al, V, Zr, Nb and W metal films sputtered at low working pressures
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September 1977
Structure and internal stress in ultra-thin silver films deposited on MgF2 and SiO substrates
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July 1978
Internal stresses in metallic films deposited by cylindrical magnetron sputtering
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November 1979
Properties and performance of chemical-vapour- deposited TiC-coated ball-bearing components
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October 1987
Stress-related effects in thin films
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April 1989
Note on the origin of intrinsic stresses in films deposited via evaporation and sputtering
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April 1989
A simple model for the formation of compressive stress in thin films by ion bombardment
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April 1993
Measurements of the intrinsic stress in thin metal films
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January 1990
Wear-resistant coatings for bearing applications
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June 1978
Surface and interface stress effects in thin films
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May 1994
Technical note: A gyro spin axis bearing performance using titanium carbide coated balls
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December 1987
Deposition of wear resistant coatings based on diamond like carbon by unbalanced magnetron sputtering
journal
October 1993
Wear-resistant hard titanium carbide coatings for space applications
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April 1990
Properties and stability of diamond-like carbon films related to bonded and unbonded hydrogen
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April 1993
Growth and configurational stability of circular, buckling-driven film delaminations
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February 1992
A methodology for determining mechanical properties of freestanding thin films and MEMS materials
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January 2003
Effect of mechanical stress induced by etch-stop nitride: impact on deep-submicron transistor performance
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February 2002
Atomic force microscopy study of the morphological shape of thin film buckling
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March 2002
A method for in situ measurement of the residual stress in thin films by using the focused ion beam
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October 2003
Full field measurements of curvature using coherent gradient sensing: application to thin film characterization
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July 1998
Mixed Mode Cracking in Layered Materials
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January 1991
Erratum to: “The role of surface stress in reconstruction, epitaxial growth and stabilization of mesoscopic structures” [Surf. Sci. Rep. 29 (1997) 193]
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October 1999
Sputtering deposited TiNi films: relationship among processing, stress evolution and phase transformation behaviors
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April 2003
Transparent thermoplastic polymers in plasma-assisted coating processes
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September 2003
A novel pulsed magnetron sputter technique utilizing very high target power densities
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December 1999
Thin film deposition: fundamentals and modeling
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November 1998
An experimental study of the influence of imperfections on the buckling of compressed thin films
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March 2002
Interfaces and stresses in thin films
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January 2000
Polymorphic phase stability in thin multilayers
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June 1998
Mechanical behaviour of metallic thin films on polymeric substrates and the effect of ion beam assistance on crack propagation
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January 2005
Stress evolution and cracking of crystalline diamond thin films on ductile titanium substrate: Analysis by micro-Raman spectroscopy and analytical modelling
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August 2011
Size effect of thermal expansion and thermal/intrinsic stresses in nanostructured thin films: Experiment and model
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October 2011
Grain growth and complex stress evolution during Volmer–Weber growth of polycrystalline thin films
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April 2014
Effects of oblique-angle deposition on intrinsic stress evolution during polycrystalline film growth
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September 2014
Phase stability and in situ growth stresses in Ti/Nb thin films
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November 2014
The influence of a brittle Cr interlayer on the deformation behavior of thin Cu films on flexible substrates: Experiment and model
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May 2015
From telephone cords to branched buckles: A phase diagram
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February 2017
On the origin of the metastable β-Ta phase stabilization in tantalum sputtered thin films
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March 2017
Influence of phase stability on the in situ growth stresses in Cu/Nb multilayered films
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June 2017
Benefits of energetic ion bombardment for tailoring stress and microstructural evolution during growth of Cu thin films
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December 2017
Effect of process parameters on injection compression molding of pickup lens
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October 2005
In situ growth stresses during the phase separation of immiscible FeCu thin films
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December 2010
Nano-scale mapping of lattice strain and orientation inside carbon core SiC fibres by synchrotron X-ray diffraction
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November 2014
Role of atomic migration in nanocrystalline stability: Grain size and thin film stress states
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April 2015
Measurement of fracture toughness by nanoindentation methods: Recent advances and future challenges
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December 2015
Residual micro-stress distributions in heat-pressed ceramic on zirconia and porcelain-fused to metal systems: Analysis by FIB–DIC ring-core method and correlation with fracture toughness
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November 2015
Uncertainty quantification of residual stress evaluation by the FIB–DIC ring-core method due to elastic anisotropy effects
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June 2016
Liquid-phase explosive crystallization of electron-beam-evaporated a-Si films induced by flash lamp annealing
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January 2013
Telephone cord buckles—A relation between wavelength and adhesion
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February 2015
A new failure mechanism in thin film by collaborative fracture and delamination: Interacting duos of cracks
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November 2015
Determination of the elastic moduli and residual stresses of freestanding Au-TiW bilayer thin films by nanoindentation
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September 2016
Origins of residual stress in thin films: Interaction between microstructure and growth kinetics
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November 2016
Design, fabrication and characterization of multilayer Cr-CrN thin coatings with tailored residual stress profiles
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December 2016
Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis
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May 2018
Focused ion beam ring drilling for residual stress evaluation
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September 2009
Quantifying eigenstrain distributions induced by focused ion beam damage in silicon
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December 2016
Stress analyses of high spatial resolution on TSV and BEoL structures
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September 2014
Depth-resolved residual stress analysis of thin coatings by a new FIB–DIC method
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October 2011
Growth of whiskers from Sn surfaces: Driving forces and growth mechanisms
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May 2013
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
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November 2012
Stress evolution during growth of 1-D island arrays: Kinetics and length scaling
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March 2015
Influence of Ni Solute segregation on the intrinsic growth stresses in Cu(Ni) thin films
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March 2016
Fabrication and testing of nanoporous Si3N4 optical filters for gas sensing applications
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August 2013
A comprehensive model of stress generation and relief processes in thin films deposited with energetic ions
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April 2006
Modelling, production and characterisation of duplex coatings (HVOF and PVD) on Ti–6Al–4V substrate for specific mechanical applications
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June 2007
Formation and behavior of unbonded hydrogen in a-C:H of various compositions and densities
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September 2009
Stress in Evaporated and Sputtered Thin Films – A Comparison
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March 2010
High power pulsed magnetron sputtering: A review on scientific and engineering state of the art
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February 2010
Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation
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December 2010
High resolution residual stress measurement on amorphous and crystalline plasma-sprayed single-splats
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July 2012
A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation
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January 2013
Growth and properties of high index Ta2O5 optical coatings prepared by HiPIMS and other methods
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February 2014
A review of metal-ion-flux-controlled growth of metastable TiAlN by HIPIMS/DCMS co-sputtering
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October 2014
Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
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July 2014
Effects of normal and shear stresses in rolling and mixed mode contact on the micropitting wear of a WC/a-C:H tribological coating
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December 2015
A review of micro-scale focused ion beam milling and digital image correlation analysis for residual stress evaluation and error estimation
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December 2015
Stability and performance of organic-inorganic thin films on polymer substrates
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March 2017
Effect of mesoscopic misfit on growth, morphology, electronic properties and magnetism of nanostructures at metallic surfaces
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December 2014
Influence of internal stress in optical thin films on their failure modes assessed by in situ real-time scratch analysis
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May 2017
Interface engineering during plasma-enhanced chemical vapor deposition of porous/dense SiN1.3 optical multilayers
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December 2004
Tailoring the adhesion of optical films on polymethyl-methacrylate by plasma-induced surface stabilization
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April 2005
A model for stress generation and stress relief mechanisms applied to as-deposited filtered cathodic vacuum arc amorphous carbon films
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June 2005
Electromigration Cu mass flow in Cu interconnections
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May 2006
Celebrating the 100th anniversary of the Stoney equation for film stress: Developments from polycrystalline steel strips to single crystal silicon wafers
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January 2009
Stress evolution in magnetron sputtered Ti–Zr–N and Ti–Ta–N films studied by in situ wafer curvature: Role of energetic particles
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December 2009
A structure zone diagram including plasma-based deposition and ion etching
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May 2010
Stress and microstructure evolution during growth of magnetron-sputtered low-mobility metal films: Influence of the nucleation conditions
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December 2010
Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
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January 2012
Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements
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March 2013
A kinetic analysis of residual stress evolution in polycrystalline thin films
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December 2012
Strain-free, single-phase metastable Ti0.38Al0.62N alloys with high hardness: metal-ion energy vs. momentum effects during film growth by hybrid high-power pulsed/dc magnetron cosputtering
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April 2014
A critical comparison between XRD and FIB residual stress measurement techniques in thin films
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December 2014
Quantitative correlation between intrinsic stress and microstructure of thin films
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April 2016
Influence of Fe(Cr) miscibility on thin film grain size and stress
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August 2016
High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity
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March 2006
Real-time stress evolution during early growth stages of sputter-deposited metal films: Influence of adatom mobility
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February 2014
A New Methodology to Analyze Instabilities in SEM Imaging
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October 2014
Direct Observation of the Thickness-Induced Crystallization and Stress Build-Up during Sputter-Deposition of Nanoscale Silicide Films
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December 2016
Nanoscale holographic interferometry for strain measurements in electronic devices
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June 2008
Thermodynamics of deposition flux-dependent intrinsic film stress
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February 2016
Making metallic glasses plastic by control of residual stress
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October 2006
Past achievements and future challenges in the development of three-dimensional photonic metamaterials
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July 2011
Epitaxial growth of Cu(001) thin films onto Si(001) using a single-step HiPIMS process
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May 2017
In-situ Observation of Cross-Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation
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March 2016
Grain Boundary Specific Segregation in Nanocrystalline Fe(Cr)
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October 2016
Cracking-assisted fabrication of nanoscale patterns for micro/nanotechnological applications
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January 2016
Rapid flash annealing of thermally reactive copolymers in a roll-to-roll process for polymer solar cells
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January 2012
Mechanical Properties of Optical Dielectric Thin Films Deposited by the Ion Plating Technique
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January 1997
A UHV‐compatible thin‐film stress‐measuring apparatus based on the cantilever beam principle
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December 1990
Measuring Ge segregation by real‐time stress monitoring during Si 1− x Ge x molecular beam epitaxy
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December 1996
An analysis technique for extraction of thin film stresses from x-ray data
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November 1997
Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction
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March 1998
On the origin of stress in magnetron sputtered TiN layers
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December 2000
The dynamic competition between stress generation and relaxation mechanisms during coalescence of Volmer–Weber thin films
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May 2001
Model for stress generated upon contact of neighboring islands on the surface of a substrate
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May 2001
Investigation of the amorphous-to-crystalline transition in Mo/Si multilayers
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July 2001
Mechanical stresses upon crystallization in phase change materials
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November 2001
Influence of segregation on the measurement of stress in thin films
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March 2002
Microstructure of thin tantalum films sputtered onto inclined substrates: Experiments and atomistic simulations
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July 2003
Reversible stress changes at all stages of Volmer–Weber film growth
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February 2004
Diffraction stress analysis in fiber-textured TiN thin films grown by ion-beam sputtering: Application to (001) and mixed (001)+(111) texture
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March 2004
Resistance Monitoring and Effects of Nonadhesion During Electromigration in Aluminum Films
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March 1968
An Apparatus for Measuring Stress in Thin Films
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August 1969
Stress field in sputtered thin films: Ion irradiation as a tool to induce relaxation and investigate the origin of growth stress
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June 2004
Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors
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January 2005
Lattice strain analysis of transistor structures with silicon–germanium and silicon–carbon source∕drain stressors
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February 2005
Microfabricated strained substrates for Ge epitaxial growth
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May 2005
High-resolution strain mapping in heteroepitaxial thin-film features
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July 2005
Mechanisms of reversible stretchability of thin metal films on elastomeric substrates
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May 2006
Mechanics of edge effects in anisotropic thin film∕substrate systems
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November 2006
Effects of laser-induced heating on Raman stress measurements of silicon and silicon-germanium structures
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June 2007
Submicron mapping of silicon-on-insulator strain distributions induced by stressed liner structures
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July 2008
Mechanical behavior of stressed films on anisotropic substrates
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November 2008
Stress gradients induced in Cu films by capping layers
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December 2008
Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions
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February 2009
Electromigration in thin aluminum films on titanium nitride
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April 1976
On the use of a multiple beam optical sensor for in situ curvature monitoring in liquids
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April 2010
Strain distribution in thin aluminum films using x‐ray depth profiling
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January 1988
Compositional dependent thin film stress states
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August 2010
The relationship between deposition conditions, the beta to alpha phase transformation, and stress relaxation in tantalum thin films
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November 1992
A New Methodology For In-Situ Residual Stress Measurement In MEMS Structures
Sebastiani, M.; Bemporad, E.; Melone, G.
STRESS-INDUCED PHENOMENA IN METALLIZATION: 11th International Workshop, AIP Conference Proceedings
https://doi.org/10.1063/1.3527116
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January 2010
Process‐induced mechanical stress in isolation structures studied by micro‐Raman spectroscopy
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October 1993
Phase transformation of sputter deposited tungsten thin films with A‐15 structure
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June 1996
Stresses, curvatures, and shape changes arising from patterned lines on silicon wafers
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August 1996
Measurements of stress during vapor deposition of copper and silver thin films and multilayers
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December 1996
Internal interfaces and intrinsic stress in thin amorphous Cu-Ti and Co-Tb films
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March 1998
The multilayer-modified Stoney’s formula for laminated polymer composites on a silicon substrate
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November 1999
Composition, residual stress, and structural properties of thin tungsten nitride films deposited by reactive magnetron sputtering
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August 2000
Kinetic model for dependence of thin film stress on growth rate, temperature, and microstructure
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April 2012
Effect of adatom surface diffusivity on microstructure and intrinsic stress evolutions during Ag film growth
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August 2012
Atom insertion into grain boundaries and stress generation in physically vapor deposited films
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July 2013
Fast and slow stress evolution mechanisms during interruptions of Volmer-Weber growth
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January 2014
Origin of stress gradients induced in capped, copper metallization
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February 2014
Growth of patterned island arrays to identify origins of thin film stress
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March 2014
Correlation of shape changes of grain surfaces and reversible stress evolution during interruptions of polycrystalline film growth
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April 2014
Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates
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September 2014
Reactive HiPIMS deposition of SiO 2 /Ta 2 O 5 optical interference filters
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December 2014
Microstructure-controlled depth gradients of mechanical properties in thin nanocrystalline films: Towards structure-property gradient functionalization
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June 2015
Volmer-Weber growth stages of polycrystalline metal films probed by in situ and real-time optical diagnostics
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November 2015
Growth stress induced tunability of dielectric permittivity in thin films
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January 2016
Compressive intrinsic stress originates in the grain boundaries of dense refractory polycrystalline thin films
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February 2016
A kinetic model for stress generation in thin films grown from energetic vapor fluxes
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April 2016
Tutorial: Understanding residual stress in polycrystalline thin films through real-time measurements and physical models
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May 2016
Interrelationship of in situ growth stress evolution and phase transformations in Ti/W multilayered thin films
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June 2016
SiN x coatings deposited by reactive high power impulse magnetron sputtering: Process parameters influencing the residual coating stress
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May 2017
Tutorial: Reactive high power impulse magnetron sputtering (R-HiPIMS)
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March 2017
How soft substrates affect the buckling delamination of thin films through crack front sink-in
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April 2017
Extended metastable Al solubility in cubic VAlN by metal-ion bombardment during pulsed magnetron sputtering: film stress vs subplantation
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July 2017
Ti segregation in regulating the stress and microstructure evolution in W-Ti nanocrystalline films
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August 2017
Intrinsic stress response of low and high mobility solute additions to Cu thin films
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December 2017
Crystallization‐front velocity during scanned laser crystallization of amorphous Ge films
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August 1980
Tribological and electrical properties of metal‐containing hydrogenated carbon films
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The determination of stresses in thin films; modelling elastic grain interaction
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Estimation of the Molecular Junction Temperatures in Four-Ball Contacts by Chemical Reaction Rate Studies
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January 1978
Attaining High Levels of Bearing Performance with a Nanocomposite Diamond-Like Carbon Coating
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Stresses and deformation processes in thin films on substrates
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Intrinsic stress in sputter-deposited thin films
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A novel pillar indentation splitting test for measuring fracture toughness of thin ceramic coatings
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May 2014
Stress in porous thin films through absorption of polar molecules (and relevance to optical coatings)
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November 1980
Tribology of diamond-like carbon films: recent progress and future prospects
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The metal flux from a rotating cylindrical magnetron: a Monte Carlo simulation
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The correlation between mechanical stress and magnetic anisotropy in ultrathin films
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Direct measurement of residual stress in sub-micron interconnects
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August 2003
The Elastic Behaviour of a Crystalline Aggregate
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May 1952
Stress evolution during and after sputter deposition of thin Cu–Al alloy films
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The role of surface stress in structural transitions, epitaxial growth and magnetism on the nanoscale
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The intrinsic stress of polycrystalline and epitaxial thin metal films
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The Tension of Metallic Films Deposited by Electrolysis
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Deformation Potentials and Mobilities in Non-Polar Crystals
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Piezoresistance Effect in Germanium and Silicon
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Surface Studies of Solids by Total Reflection of X-Rays
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Evanescent absorption in kinematic surface Bragg diffraction
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Effect of ion bombardment on stress in thin metal films
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Weak temperature dependence of stress relaxation in as-deposited polycrystalline gold films
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Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy
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April 2008
Direct Evidence for Effects of Grain Structure on Reversible Compressive Deposition Stresses in Polycrystalline Gold Films
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June 2009
Influence of Phase Transformation on Stress Evolution during Growth of Metal Thin Films on Silicon
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March 2010
In Situ Thin Film Growth Stresses during Chemical Ordering
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How Does Adhesion Induce the Formation of Telephone Cord Buckles?
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Self-Replicating Cracks: A Collaborative Fracture Mode in Thin Films
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Intrinsic Compressive Stress in Polycrystalline Films is Localized at Edges of the Grain Boundaries
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December 2017
Mechanical stresses in (sub)monolayer epitaxial films
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Origin of Compressive Residual Stress in Polycrystalline Thin Films
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Reversible Stress Relaxation during Precoalescence Interruptions of Volmer-Weber Thin Film Growth
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Compressive Stress in Polycrystalline Volmer-Weber Films
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April 2005
Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction
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January 2005
Simultaneous determination of experimental elastic and thermal strains in thin films
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X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
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FinFET-a self-aligned double-gate MOSFET scalable to 20 nm
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Residual Stress Measurement on a MEMS Structure With High-Spatial Resolution
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Thin-Film Permeation-Barrier Technology for Flexible Organic Light-Emitting Devices
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A Logic Nanotechnology Featuring Strained-Silicon
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Impact of Fin Doping and Gate Stack on FinFET (110) and (100) Electron and Hole Mobilities
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Plasma deposition of optical films and coatings: A review
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Grain Growth and Stress Relief in Thin Films
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Phase transformation of thin sputter-deposited tungsten films at room temperature
Rossnagel, S. M.; Noyan, I. C.; Cabral, C.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 20, Issue 5
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January 2002
Microstructural evolution during film growth
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September 2003
Metal versus rare-gas ion irradiation during Ti 1− x Al x N film growth by hybrid high power pulsed magnetron/dc magnetron co-sputtering using synchronized pulsed substrate bias
Greczynski, Grzegorz; Lu, Jun; Jensen, Jens
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 30, Issue 6
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November 2012
Stress engineering using low oxygen background pressures during Volmer–Weber growth of polycrystalline nickel films
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Growth and characterization of α and β -phase tungsten films on various substrates
Lee, Jeong-Seop; Cho, Jaehun; You, Chun-Yeol
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 34, Issue 2
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Internal stresses in titanium, nickel, molybdenum, and tantalum films deposited by cylindrical magnetron sputtering
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Compressive stress and inert gas in Mo films sputtered from a cylindrical‐post magnetron with Ne, Ar, Kr, and Xe
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Internal stresses in Cr, Mo, Ta, and Pt films deposited by sputtering from a planar magnetron source
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March 1982
Revised structure zone model for thin film physical structure
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April 1984
The influence of discharge current on the intrinsic stress in Mo films deposited using cylindrical and planar magnetron sputtering sources
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May 1985
The microstructure of sputter‐deposited coatings
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November 1986
Directed sputter deposition of AlCu: Film microstructure and microchemistry
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Critical ion energy and ion flux in the growth of films by plasma‐enhanced chemical‐vapor deposition
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Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 12, Issue 4
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Plasma deposition of low‐stress electret films for electroacoustic and solar cell applications
Klemberg‐Sapieha, J. E.; Martinu, L.; Wertheimer, M. R.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 14, Issue 5
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Effect of interface on the characteristics of functional films deposited on polycarbonate in dual-frequency plasma
Klemberg-Sapieha, J. E.; Poitras, D.; Martinu, L.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 15, Issue 3
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Structure of the interfacial region between polycarbonate and plasma-deposited SiN1.3 and SiO2 optical coatings studied by ellipsometry
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Stretchable and Foldable Silicon Integrated Circuits
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In Situ Stress Measurements during Copper Electrodeposition on (111)-Textured Au
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Intrinsic Stress in Evaporated Metal Films
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Measurements of the Phase and Stress Evolution during Initial Lithiation of Sn Electrodes
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A state-of-the-art review of micron-scale spatially resolved residual stress analysis by FIB-DIC ring-core milling and other techniques
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X-ray residual stress analysis in thin films under grazing incidence – basic aspects and applications
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Implementation and Development of the Incremental Hole Drilling Method for the Measurement of Residual Stress in Thermal Spray Coatings
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Optical and mechanical characterization of evaporated SiO_2 layers Long-term evolution
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Mechanical stress and thermal-elastic properties of oxide coatings for use in the deep-ultraviolet spectral region
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Mechanical characteristics of optical coatings prepared by various techniques: a comparative study
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Ultra-low-stress thin-film interference filters
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January 2006
Mechanical and thermoelastic characteristics of optical thin films deposited by dual ion beam sputtering
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Design and fabrication of stress-compensated optical coatings: Fabry–Perot filters for astronomical applications
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Analysis of Bi-Metal Thermostats
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January 1925
Comparative study of ALD SiO_2 thin films for optical applications
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January 2016
Crystallite coalescence: A mechanism for intrinsic tensile stresses in thin films
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Systematic Characterization of Pseudomorphic (110) Intrinsic SiGe Epitaxial Films for Hybrid Orientation Technology with Embedded SiGe Source/Drain
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Stress Determination in Textured Thin Films Using X-Ray Diffraction
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Variational eigenstrain analysis of synchrotron diffraction measurements of residual elastic strain in a bent titanium alloy bar
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