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Electronic and reactivity changes in epitaxially grown Ce1-xZrxO2-δ (111) thin films

Journal Article · · Surface Science
 [1];  [2];  [3];  [4];  [1]
  1. Univ. of Colorado, Boulder, CO (United States)
  2. US Department of Energy (USDOE), Golden, CO (United States)
  3. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
  4. Crysalis BioSciences Inc., Louisville, CO (United States)
Ceria composite catalysts have long been used for ketonization reactions, which is a valuable chemistry for the upgrading of biomass-derived carboxylates. To better understand the interaction of zirconia with ceria in the context of ketonization, thin epitaxial films of ceria-zirconia mixed metal oxide Ce1-xZrxO2-δ (x = 0-1) were grown on a Pt(111) substrate in ultrahigh vacuum conditions and studied with X-ray photoelectron spectroscopy (XPS). Core level and valence band XPS results suggest a strong interaction between ceria and zirconia cations, possibly due to increased filling of unoccupied 4f0 orbitals of ceria from neighboring Zr cations in the lattice structure. This leads to a partial reduction of ceria from Ce4+ to Ce3+, with Zr remaining predominantly in the 4+ oxidation state. Ketonization of acetic acid was studied using temperature programmed desorption (TPD) and high-resolution electron energy loss spectroscopy (HREELS). These results found ketonization over mixed Ce-Zr composite oxides exhibited lower activation energies than for pure CeO2 and ZrO2, with Ce0.38Zr0.62O2-δ exhibiting the highest yield of acetone among the studied surfaces. In conclusion, these results suggest the high activity of Ce-Zr catalysts appears to be a result of oxygen vacancy formation, stabilized by electron donation from Zr cations.
Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
National Science Foundation (NSF); USDOE Laboratory Directed Research and Development (LDRD) Program
Grant/Contract Number:
AC36-08GO28308
OSTI ID:
2558982
Report Number(s):
NREL/JA--5K00-94363
Journal Information:
Surface Science, Journal Name: Surface Science Vol. 757; ISSN 0039-6028
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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Epitaxial growth and characterization of Ce1−xZrxO2 thin films
  • Gao, Y.; Herman, G. S.; Thevuthasan, S.
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 17, Issue 3 https://doi.org/10.1116/1.581671
journal May 1999

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