Dynamics of electron attachment to AOT/H{sub 2}O reversed micelles
- Case Western Reserve Univ., Cleveland, OH (United States)
- Hahn-Meitner Institut, Berlin (Germany)
- Notre Dame Univ., IN (United States)
Values of the observed rate constant, {kappa}{sub obs}, of excess electrons attaching to aerosol OT (AOT) reversed micelles encapsulating varying quantities of water were measured in isooctane and tetramethylsilane (TMS) at 21 {degrees}C using a picosecond-pulse conductivity technique. Dynamic light scattering was used to determine the micellar radii in TMS from which aggregation numbers of the micelles were determined. In the lower-mobility isooctane ({mu}{sub e} = 5.3 cm{sup 2}/(V s)), values of the {kappa}{sub obs} approach the diffusion-controlled attachment rate, {kappa}{sub obs} in TMS ({mu}{sub 3} = 100 cm{sup 2}/(V s)) are 8-fold less than {kappa}{sub d} at the maximum ratio of H{sub 2}O/AOT = 27 that was studied. Several factors that could contribute to {kappa}{sub obs} appearing to exceed {kappa}{sub d} in isooctane are discussed, and the less efficient attachment of electrons to the same reversed micelles in TMS compared to attachment in isooctane is interpreted in terms of the relative attachment time, {tau}{sub r}. With this model, the {tau}{sub a} of electrons attaching to micelles at a diffusion-controlled rate is <1 ps and may be identified with the solvation time of electrons in water. 54 refs., 5 figs., 2 tabs.
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- FG02-88ER60617
- OSTI ID:
- 255269
- Journal Information:
- Journal of Physical Chemistry, Vol. 96, Issue 5; Other Information: PBD: 5 Mar 1992
- Country of Publication:
- United States
- Language:
- English
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