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Ionization effects in single-shot carrier-envelope phase detection with gas-gap devices

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/5.0246794· OSTI ID:2549426
 [1];  [2];  [3];  [4];  [4];  [2];  [5];  [1]
  1. Ludwig Maximilian Univ. of Munich, Munich (Germany); Max Planck Institute of Quantum Optics, Garching (Germany); UltraFast Innovations GmbH, Garching (Germany)
  2. Ludwig Maximilian Univ. of Munich, Munich (Germany); Max Planck Institute of Quantum Optics, Garching (Germany)
  3. Max Planck Institute of Quantum Optics, Garching (Germany)
  4. UltraFast Innovations GmbH, Garching (Germany)
  5. Ludwig Maximilian Univ. of Munich, Munich (Germany); Max Planck Institute of Quantum Optics, Garching (Germany); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Stanford Univ., CA (United States)
The carrier-envelope phase (CEP) is a key parameter for attosecond waveform control of ultrashort laser pulses. For laser systems with high repetition rates, however, single-shot CEP detection is still challenging. Building on recent findings on phase detection with electric current generation in gases, we show that with an optimized detection method, a long-term stable single-shot phase detection is feasible. We investigate the achievable performance depending on various parameters such as pulse duration, gas pressure, or incident intensity. The latter exhibits a regime where the saturation of the ionization process boosts the phase sensitivity of the signal, which is elucidated by numerical calculations.
Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Organization:
USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-76SF00515
OSTI ID:
2549426
Alternate ID(s):
OSTI ID: 2546996
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 13 Vol. 126; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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