Effect of local electric fields on microchannel plate detection of incident 20 keV protons

Journal Article · Mon Jan 01 04:00:00 EST 1996 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1146562· OSTI ID:253543

Funsten, H O; Suszcynsky, D M; Harper, R W; Nordholt, J E; Barraclough, B L ^[1]

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1. Space and Atmospheric Sciences Group, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

We present data demonstrating the influence of an applied electric field {ital E} oriented normal to the input surface of a microchannel plate (MCP) detector on the critical operating parameters of the detector, including the quantum detection efficiency, the spatial resolution, and pulse height distribution. The MCP detector response is characterized using 20 keV protons as the primary radiation. An applied electric field {ital E}{much_gt}-4 V/mm, where a negative value of {ital E} corresponds to a nearby object that is biased positive relative to the input surface, results in a high spatial resolution and a quantum detection efficiency that is approximately equal to the open area ratio of the MCP. An electric field -1{much_gt}{ital E}{much_gt}5 V/mm results in low spatial resolution, in which up to 32{percent} of the measured signal appears as a localized noise that extends several millimeters from the point of ion impact, and a maximum quantum detection efficiency of approximately 0.87. Furthermore, a separate peak in the pulse-height distribution arises from ions striking the web of the MCP detector and has a much lower pulse magnitude than that of ions striking channels. For {ital E}{approx_gt}5 V/mm, the spatial resolution increases, and the quantum detection efficiency slightly decreases from its maximum value with increasing {ital E}. The characteristics of each of these electric field configurations are analyzed in the context of the yield and transport of secondary electrons created at the web of the MCP detector, and the results can be scaled to other ions and energies according to the secondary electron yield of ions striking the web. {copyright} {ital 1996 American Institute of Physics.}

• OSTI ID: 253543
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 67; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ELECTRIC FIELDS
ELECTRON MULTIPLIER DETECTORS
KEV RANGE 10-100
PROTON DETECTION
QUANTUM EFFICIENCY
SECONDARY EMISSION
SPATIAL RESOLUTION