Nanosecond Transient Validation of Surge Arrester Models to Predict Electromagnetic Pulse Response

Bowman, Tyler C.; Kmieciak, Thomas Gary; Biedermann, Laura Butler

doi:10.1109/temc.2024.3486980

Nanosecond Transient Validation of Surge Arrester Models to Predict Electromagnetic Pulse Response

Journal Article · Tue Nov 12 00:00:00 EST 2024 · IEEE Transactions on Electromagnetic Compatibility

DOI:https://doi.org/10.1109/temc.2024.3486980· OSTI ID:2530852

^[1]; Kmieciak, Thomas Gary ^[2]; ^[1]

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Exelon Corporation, Chicago, IL (United States)

The impact of high-altitude electromagnetic pulse events on the electric grid is not fully understood, and validated modeling of mitigations, such as lightning surge arresters (LSAs) is necessary to predict the propagation of very fast transients on the grid. Experimental validation of high frequency models for surge arresters is an active area of research. Further, this article serves to experimentally validate a previously defined ZnO LSA model using four metal-oxide varistor pucks and nanosecond scale pulses to measure voltage and current responses. The SPICE circuit models of the pucks showed good predictability when compared to the measured arrester response when accounting for a testbed inductance of approximately 100 nH. Additionally, the comparatively high capacitance of low-profile arresters show a favorable response to high-speed transients that indicates the potential for effective electromagnetic pulse mitigation with future materials design.

View Accepted Manuscript (DOE)

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: NA0003525

OSTI ID:: 2530852

Report Number(s):: SAND--2025-02323J

Journal Information:: IEEE Transactions on Electromagnetic Compatibility, Journal Name: IEEE Transactions on Electromagnetic Compatibility Journal Issue: 1 Vol. 67; ISSN 0018-9375

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

References (14)

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