Spin fluctuation driven magnetoresistance, domain Re-distribution and anomalous Hall effect in helical antiferromagnetic Eu metal thin films
- University of Wyoming, Laramie, WY (United States)
Europium (Eu) metal has a body centered cubic crystal structure which, upon a paramagnetic-to-helical magnetic phase transition, undergoes a body centered tetragonal distortion. The magnetic helix appears below a Néel temperature (TN) of ~90 K, and an applied magnetic field gives rise to conical magnet structure. We have prepared Eu metal thin films on Si (001) substrates using Eu metal as a target by pulsed laser deposition and studied the transport properties by a four-probe method. The resistance shows a sudden slope change at TN of 88 K. The magnetoresistance (MR) is positive at temperatures below 30 K and exhibits negative values above that. Our analyses show that the positive MR at low temperatures originates from magnetic field induced spin fluctuation, and the negative MR at higher temperature is a result of suppression of critical spin fluctuation of the Eu spins by the magnetic field. The Eu film also shows hysteretic MR behaviors in mid field range, which is a result of re-distribution of the helical antiferromagnetic domains by the magnetic fields. We have also studied the transverse magnetotransport in the Eu thin films. The observed anomalous Hall effect is believed to be associated with the magnetic moment induced by the field or due to the helical spin structure of Eu itself.
- Research Organization:
- University of Wyoming, Laramie, WY (United States)
- Sponsoring Organization:
- National Science Foundation (NSF); USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)
- Grant/Contract Number:
- SC0020074; SC0021281
- OSTI ID:
- 2528100
- Alternate ID(s):
- OSTI ID: 2553075
- Journal Information:
- AIP Advances, Journal Name: AIP Advances Journal Issue: 3 Vol. 15; ISSN 2158-3226
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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