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Support Vector Machine (SVM)-Based Synchronized Fault Detection for 100% Renewable Microgrids

Conference ·
OSTI ID:2500367
Traditional protection schemes face significant challenges when applied to microgrids with high penetrations of renewables with inverter-based resources (IBRs). The proliferation of advanced sensing and communication technologies has generated copious data, offering an opportunity to overcome these limitations using data-driven machine learning approaches. This work proposes a novel approach based on a support vector machine (SVM) for detecting faults within a 100% renewable microgrid. The approach encompasses a systematic offline training stage for the development of a linear SVM-based fault detection algorithm. This process covers offline data collection from the microgrid under study, the extraction of features such as positive- and negative-sequence components and the total harmonic distortion of the voltage and current measurements of the relays, and the design of the linear SVM-based classifier. During the online implementation, however, different classifiers can exhibit asynchronicity in detecting the fault inception at different subcycle-to-cycle period-level delays. To circumvent this asynchronicity issue, a separate algorithm is developed for each relay to estimate the fault inception time as close to the real fault time. The performance of the proposed SVM-based synchronized fault detection method is evaluated using online time-domain simulation studies on a microgrid test system. The results corroborate the reliability of the fault detection scheme when tested under various fault cases (fault types, locations, and impedances) and non-fault cases during both grid-tied and islanded operation modes.
Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE National Renewable Energy Laboratory (NREL), Laboratory Directed Research and Development (LDRD) Program
DOE Contract Number:
AC36-08GO28308;
OSTI ID:
2500367
Report Number(s):
NREL/PR-5D00-91883; MainId:93661; UUID:8f4743e9-0625-471f-9fd5-27818f253cc9; MainAdminId:75692
Conference Information:
Presented at the 50th Annual Conference of the IEEE Industrial Electronics Society (IECON), 3-6 November 2024, Chicago, Illinois
Country of Publication:
United States
Language:
English