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Non-contact imaging of terahertz surface currents with aperture-type near-field microscopy

Journal Article · · Optics Express
DOI:https://doi.org/10.1364/oe.531690· OSTI ID:2498474
 [1];  [1];  [1];  [2];  [3];  [4];  [4];  [5];  [6]
  1. Univ. College London (United Kingdom)
  2. Eidgenoessische Technische Hochschule (ETH), Zurich (Switzerland)
  3. Lancaster Univ., Bailrigg (United Kingdom)
  4. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies
  5. Queen Mary Univ. of London (United Kingdom)
  6. Univ. College London (United Kingdom); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States). Center for Integrated Nanotechnologies (CINT)
Terahertz (THz) near-field imaging and spectroscopy provide valuable insights into the fundamental physical processes occurring in THz resonators and metasurfaces on the subwavelength scale. However, so far, the mapping of THz surface currents has remained outside the scope of THz near-field techniques. In this study, we demonstrate that aperture-type scanning near-field microscopy enables non-contact imaging of THz surface currents in subwavelength resonators. Through extensive near-field mapping of an asymmetric D-split-ring THz resonator and full electromagnetic simulations of the resonator and the probe, we demonstrate the correlation between the measured near-field images and the THz surface currents. The observed current dynamics in the interval of several picoseconds reveal the interplay between several excited modes, including dark modes, whereas broadband THz near-field spectroscopy analysis enables the characterization of electromagnetic resonances defined by the resonator geometry.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)
Grant/Contract Number:
NA0003525
OSTI ID:
2498474
Report Number(s):
SAND--2025-00070J
Journal Information:
Optics Express, Journal Name: Optics Express Journal Issue: 14 Vol. 32; ISSN 1094-4087
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English

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